Nothing Special   »   [go: up one dir, main page]

CN106772146B - Hall probe fixing mechanism for centering - Google Patents

Hall probe fixing mechanism for centering Download PDF

Info

Publication number
CN106772146B
CN106772146B CN201710186451.2A CN201710186451A CN106772146B CN 106772146 B CN106772146 B CN 106772146B CN 201710186451 A CN201710186451 A CN 201710186451A CN 106772146 B CN106772146 B CN 106772146B
Authority
CN
China
Prior art keywords
hall probe
clamping
centering
hall
led
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201710186451.2A
Other languages
Chinese (zh)
Other versions
CN106772146A (en
Inventor
臧宗旸
龙全红
王城
廖树清
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institute of Fluid Physics of CAEP
Original Assignee
Institute of Fluid Physics of CAEP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institute of Fluid Physics of CAEP filed Critical Institute of Fluid Physics of CAEP
Priority to CN201710186451.2A priority Critical patent/CN106772146B/en
Publication of CN106772146A publication Critical patent/CN106772146A/en
Application granted granted Critical
Publication of CN106772146B publication Critical patent/CN106772146B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/0047Housings or packaging of magnetic sensors ; Holders
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07Hall effect devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/10Plotting field distribution ; Measuring field distribution

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

The invention discloses a Hall probe fixing mechanism for centering, which comprises a lifting table, wherein two clamping mechanisms are arranged on the lifting table, two clamping mechanisms respectively clamp two points of the Hall probe, and a plurality of LED lamps used for displaying the contact between the clamping points and the Hall probe are arranged on each clamping mechanism. According to the invention, the two clamping mechanisms are arranged on the lifting platform and used for clamping the Hall probe, meanwhile, the LED lamps are arranged on the clamping mechanisms, and the contact condition of the clamping points and the Hall probe is displayed through the LED lamps, so that the Hall probe can be fixed under the condition of centering, and thus, whether the clamping contact surface is contacted with the Hall probe or not is judged through the on-off of the LED lamps, the clamping accuracy under the condition of centering is greatly improved, the effect of external force on the Hall probe is avoided, and the probability of deformation of the Hall probe is reduced.

Description

Hall probe fixing mechanism for centering
Technical Field
The invention relates to the field of accurate measurement of magnetic field distribution of the axis of a solenoid coil of an accelerator beam transmission system, in particular to a Hall probe fixing mechanism for centering.
Background
The accelerator beam transport system is an important component of the accelerator. For this reason, a considerable technical specification is put forward for the beam-transmitting system of the accelerator, and in order to meet the technical requirements, development of measurement of the beam-transmitting element is particularly important, including accurate measurement of the magnetic field distribution of the axis of the solenoid coil. In particular, accurate beam transmission numerical simulation calculation requires accurate magnetic field distribution parameters, and then accurate actual measurement magnetic field distribution is verified, a high-accuracy three-dimensional magnetic field measuring instrument is applied in the actual measurement magnetic field measurement process, the motion positioning accuracy is less than or equal to +/-5 mu m, the repeated positioning accuracy is less than or equal to 1.5 mu m, when the positions of a Hall probe and a measured coil are determined, a reference coordinate is established in space by using a laser tracker, the position relation between the Hall probe and the measured coil is determined by measuring the positions of the Hall probe and the coil in the reference coordinate, in the process of using the laser tracker, a light guiding ball is required to be completely contacted with an object to be measured, in the process of measuring the position of the Hall probe, the Hall probe is an elongated rod, and the Hall probe connecting rod is also connected with the Hall probe position fine tuning plug gauge.
At present, a lifting platform is placed below a Hall probe and is supported by the platform in the lifting process, so that a light guiding ball is not subjected to position change in the contact process with the Hall probe, whether the lifting platform is in contact with the Hall probe or not is observed by naked eyes to serve as a judgment basis, reliability is poor, repeated measurement is needed for several times to verify whether measurement is accurate or not in order to ensure the reliability of data, a great amount of time is spent, waste of manpower and material resources is caused, and measurement of position accuracy cannot be well ensured even if repeated measurement verification is carried out, so that the control of the accuracy of magnetic field measurement is possibly influenced.
Disclosure of Invention
The invention aims to provide a Hall probe fixing mechanism for centering, which solves the problem that a Hall probe is difficult to fix after centering in the prior art, reduces the investment of manpower and material resources, and improves the measurement precision.
The invention is realized by the following technical scheme:
the utility model provides a hall probe fixed establishment for centering, includes the elevating platform be provided with two fixture on the elevating platform, two fixture centre gripping hall probe's two points respectively are provided with a plurality of LED lamps that are used for showing the contact of clamping point and hall probe on every fixture. In the field of accurate beam transmission numerical simulation calculation of an accelerator beam transmission system, a reliable method is not available for centering and then fixing a Hall probe, the observation is very difficult to be accurate through the existing visual observation mode, according to the actual operation requirement, the inventor proposes the technical scheme of the application to solve the problem of fixing the Hall probe after centering, two clamping mechanisms are arranged on a lifting platform and used for clamping the Hall probe, an LED lamp is arranged on the clamping mechanisms, the contact condition of a clamping point and the Hall probe is displayed through the LED lamp, and therefore the Hall probe can be fixed under the centering condition, whether a clamping contact surface is contacted with the Hall probe or not is judged through the on-off of the LED lamp, the clamping accuracy under the centering condition is greatly improved, the effect of external force on the Hall probe is avoided, and the probability of deformation of the Hall probe is reduced.
Specifically, fixture include the support of fixing on the elevating platform, be provided with an adjusting frame on the support, be provided with four and LED lamp one-to-one thousandths on adjusting frame, every LED lamp positive pole is connected the thousandth head of corresponding direction, hall probe and LED power supply's positive pole switch on, the negative pole of every LED lamp is connected LED power supply's negative pole. Through setting up the support, set up an adjusting frame on two supports respectively, set up four thousand minute heads on adjusting the frame, hall probe draws forth from the hall probe connecting rod and passes hall probe position fine setting feeler gauge, pass two adjusting frame, come the centre gripping hall probe through four thousand minute heads, two positions of two adjusting frame with hall probe carry out the centre gripping, as to how to judge when it changes contact clamping state from the separation state to every face, be realized through the bright of LED lamp, the thousandth head of corresponding direction is connected to every LED lamp positive pole, hall probe and LED power supply's positive pole switches on, the negative pole of LED power supply is connected to every LED lamp, when thousand minute heads slowly are close to hall probe from the distance and just contact hall probe, LED power supply, thousand minute heads, the LED lamp, hall probe constitutes the return circuit, the LED lamp goes out the regulation that can stop thousand minute heads so, so repeatedly, when 8 LED lamps of two centre gripping departments just go on the centre gripping with hall probe when just going out from the change bright, hold it, the external force is not exerted to it again when keeping it, deformation is avoided.
The lifting platform is provided with positioning holes distributed in a matrix, and the bottom of the bracket with the structure of a Chinese character 'ji' is fixedly connected with the lifting platform through bolts. Furthermore, through the arrangement of the matrix distribution holes, the positions and the directions of the two brackets can be changed, the basically parallel state of the brackets can be easily maintained, and meanwhile, the operation is easy, so that the actual measurement is convenient.
Compared with the prior art, the invention has the following advantages and beneficial effects:
1. according to the Hall probe fixing mechanism for centering, the two clamping mechanisms are arranged on the lifting platform and used for clamping the Hall probe, meanwhile, the LED lamps are arranged on the clamping mechanisms, and the contact condition of the clamping points and the Hall probe is displayed through the LED lamps, so that the Hall probe can be fixed under the condition of centering, and therefore, whether the clamping contact surface is contacted with the Hall probe or not is judged through the on-off of the LED lamps, the clamping accuracy under the condition of centering is greatly improved, the effect of external force on the Hall probe is avoided, and the probability of deformation of the Hall probe is reduced;
2. according to the Hall probe fixing mechanism for centering, the two brackets are respectively provided with the rectangular adjusting frames, the four thousand heads are arranged on the adjusting frames, the Hall probes are LED out from the Hall probe connecting rod and pass through the Hall probe position fine-tuning plug gauge, the Hall probes are clamped through the two adjusting frames by the four thousand heads, two parts of the Hall probes are clamped in front of and behind the two adjusting frames, how each face judges when the two faces are in contact with the clamping state from the separation state is realized by the on-off of the LED lamps, the positive electrode of each LED lamp is connected with the micrometer head in the corresponding direction, the Hall probes are conducted with the positive electrode of the LED power supply, the negative electrode of each LED lamp is connected with the negative electrode of the LED power supply, when the micrometer head is gradually close to the Hall probes from a distance and just contacts the Hall probes, the LED power supply, the micrometer heads, the LED lamps and the Hall probes form a loop, the adjustment of the micrometer head can be stopped immediately, and repeated, when the 8 LED lamps at the two clamping positions are just in the center, the Hall probes are just in the center, the hall probes are just in the center, and the deformation is not generated;
3. the Hall probe fixing mechanism for centering can change the positions and the directions of the two brackets through the arrangement of the matrix distribution holes, is easy to maintain the basically parallel state, is easy to operate, is convenient for actual measurement, and ensures that the Hall probe is fixed on the premise of not changing the positions.
Drawings
The accompanying drawings, which are included to provide a further understanding of embodiments of the invention and are incorporated in and constitute a part of this application, illustrate embodiments of the invention. In the drawings:
FIG. 1 is a schematic diagram of the structure of the present invention.
Reference numerals and corresponding features in the drawings part name of (c):
1-lifting table, 2-Hall probe, 3-bracket, 4-kilo-head, 5-LED lamp, 6-Hall probe position fine tuning plug gauge, 7-Hall probe connecting rod and 8-locating hole.
Detailed Description
For the purpose of making apparent the objects, technical solutions and advantages of the present invention, the present invention will be further described in detail with reference to the following examples, which are illustrative embodiments of the present invention and the description thereof are only for explaining the present invention and are not limiting the present invention.
Examples
As shown in figure 1, the Hall probe fixing mechanism for centering comprises a lifting platform 1, wherein the lifting platform 1 is provided with positioning holes 8 distributed in a matrix, two 'several' -shaped brackets are fixed on the lifting platform 1 through bolts, and the positions and the directions of the two brackets 3 can be changed through the arrangement of the positioning holes 8 distributed in the matrix, so that the basically parallel state of the brackets can be easily maintained, and the operation is easy; each bracket 3 is provided with a rectangular adjusting frame, the adjusting frames in the present example are rectangular, and can also be round, diamond or other irregular shapes according to actual requirements, four micrometer heads 4 are arranged on the adjusting frames, the Hall probe 2 is LED out from a Hall probe connecting rod 7 and passes through a Hall probe position fine adjustment plug gauge 6, two adjusting frames pass through the two adjusting frames, the Hall probe 2 is clamped by the four micrometer heads 4, two parts of the Hall probe 2 are clamped by the two adjusting frames in sequence, as to how each face judges when the face changes from a separation state to a contact clamping state, the on-off state of the LED lamp 5 is realized, every LED lamp 5 positive pole is connected the thousandth head 4 of corresponding direction, hall probe 2 and LED power supply's positive pole is switched on, the negative pole of every LED lamp 5 is connected LED power supply's negative pole, when thousandth head 4 is close to hall probe 2 from the distance and just contact hall probe 2 slowly, LED power supply, thousandth head 4, LED lamp 5, hall probe 2 constitutes the return circuit, LED lamp 5 is from the extinction brightening, so can stop the regulation of thousand minutes immediately, so repeatedly, when 8 LED lamps 5 of two centre gripping departments just from the extinction brightening, just will the centre gripping of hall probe that will have centered, when keeping its centering, again do not exert external force to hall probe, avoid its production deformation.
The foregoing description of the embodiments has been provided for the purpose of illustrating the general principles of the invention, and is not meant to limit the scope of the invention, but to limit the invention to the particular embodiments, and any modifications, equivalents, improvements, etc. that fall within the spirit and principles of the invention are intended to be included within the scope of the invention.

Claims (2)

1. The utility model provides a hall probe fixed establishment for centering, includes elevating platform (1), its characterized in that: two clamping mechanisms are arranged on the lifting table (1), the two clamping mechanisms respectively clamp two points of the Hall probe (2), and a plurality of LED lamps (5) for displaying contact between the clamping points and the Hall probe are arranged on each clamping mechanism;
the clamping mechanism comprises a support (3) fixed on a lifting table (1), an adjusting frame is arranged on the support (3), four thousand heads (4) which are in one-to-one correspondence with the LED lamps (5) are arranged on the adjusting frame, the positive electrode of each LED lamp (5) is connected with the thousand heads (4) in the corresponding direction, the Hall probe (2) is conducted with the positive electrode of the LED power supply, and the negative electrode of each LED lamp (5) is connected with the negative electrode of the LED power supply.
2. The centering hall probe fixing mechanism according to claim 1, wherein: the lifting table (1) is provided with positioning holes (8) distributed in a matrix, and the bottom of the bracket (3) with the shape of a Chinese character 'ji' is fixedly connected with the lifting table (1) through bolts.
CN201710186451.2A 2017-03-24 2017-03-24 Hall probe fixing mechanism for centering Active CN106772146B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201710186451.2A CN106772146B (en) 2017-03-24 2017-03-24 Hall probe fixing mechanism for centering

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710186451.2A CN106772146B (en) 2017-03-24 2017-03-24 Hall probe fixing mechanism for centering

Publications (2)

Publication Number Publication Date
CN106772146A CN106772146A (en) 2017-05-31
CN106772146B true CN106772146B (en) 2023-06-20

Family

ID=58967385

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710186451.2A Active CN106772146B (en) 2017-03-24 2017-03-24 Hall probe fixing mechanism for centering

Country Status (1)

Country Link
CN (1) CN106772146B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107702649B (en) * 2017-11-24 2024-03-15 中国工程物理研究院流体物理研究所 Hall probe high-precision position acquisition device
CN112782618B (en) * 2021-01-26 2021-11-23 中国科学院近代物理研究所 Device and method for detecting magnetic field parameter calculation value of dipolar electromagnet

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN203101511U (en) * 2012-12-17 2013-07-31 天津力神电池股份有限公司 Testing device for testing polymer lithium ion battery case resistance
CN204989439U (en) * 2015-04-28 2016-01-20 长沙天恒测控技术有限公司 Hall probe mount and have its teslameter calibrating installation

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5706515B2 (en) * 2010-04-13 2015-04-22 カスケード マイクロテック インコーポレイテッドCascade Microtech,Incorporated Method and apparatus for bringing probe tip into contact with array of contact surfaces
JP5618091B2 (en) * 2011-05-10 2014-11-05 Tdk株式会社 Magnetic field detection apparatus and method
CN102706272B (en) * 2012-05-31 2016-02-10 中国工程物理研究院应用电子学研究所 A kind of axle center, Novel barrel-type magnetic field measurement mechanism
CN203012087U (en) * 2013-01-25 2013-06-19 深圳市摩西尔电子有限公司 Contact pin lifting device in image data collecting device
CN206573702U (en) * 2017-03-24 2017-10-20 中国工程物理研究院流体物理研究所 A kind of centering hall probe fixed mechanism

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN203101511U (en) * 2012-12-17 2013-07-31 天津力神电池股份有限公司 Testing device for testing polymer lithium ion battery case resistance
CN204989439U (en) * 2015-04-28 2016-01-20 长沙天恒测控技术有限公司 Hall probe mount and have its teslameter calibrating installation

Also Published As

Publication number Publication date
CN106772146A (en) 2017-05-31

Similar Documents

Publication Publication Date Title
CN203443524U (en) Engine cylinder head oil nozzle hole depth gauge and calibration device thereof
CN106772146B (en) Hall probe fixing mechanism for centering
CN103286452A (en) Laser micro hole processing method and laser micro hole processing device
CN111579152A (en) Six-dimensional force sensor dynamic calibration device and calibration method thereof
CN203739427U (en) Laser adopted marking machine for lights
CN205262381U (en) General measuring instrument of big flange of tapered roller bearing inner circle
CN202149732U (en) On-line rapid size detection device
CN105415095A (en) Fast locating instrument for numerical control machining original point and positioning method of numerical control machining original point
CN206573702U (en) A kind of centering hall probe fixed mechanism
CN103292745B (en) The coaxality measuring mechanism of orifice in a kind of chorista
CN203024732U (en) Optical lever measuring device with laser sight
CN110243325B (en) Measuring device for long shaft parts and using method
CN103940378A (en) Laser flatness measuring instrument with nine laser transmitters
CN205102793U (en) Accurate adjusting device of many breadths 3D scanner laser distance module
CN202630902U (en) Laser measure seat used for fixture installation
CN105157639A (en) Combined positioning device and positioning method
CN206593557U (en) A kind of automobile exhaust pipe rear class post-processes assembly checking tool
CN213274018U (en) Battery pack upper cover detection device
CN213515335U (en) Disc locating pin inserts detection tool
CN203758471U (en) Nine-head laser flatness measuring instrument
CN212180174U (en) Six-dimensional force sensor dynamic calibration device
CN209087364U (en) LED automatic checking device
CN205066723U (en) Combined positioning device
CN206832194U (en) A kind of laser diameter measurer of measuring steel wire diameter
CN220583241U (en) Electric power foundry goods leads to no-go gage trimming means

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant