BRPI0816242A2 - ferramenta de fundo de poço de alta temperatura - Google Patents
ferramenta de fundo de poço de alta temperaturaInfo
- Publication number
- BRPI0816242A2 BRPI0816242A2 BRPI0816242A BRPI0816242A BRPI0816242A2 BR PI0816242 A2 BRPI0816242 A2 BR PI0816242A2 BR PI0816242 A BRPI0816242 A BR PI0816242A BR PI0816242 A BRPI0816242 A BR PI0816242A BR PI0816242 A2 BRPI0816242 A2 BR PI0816242A2
- Authority
- BR
- Brazil
- Prior art keywords
- high temperature
- downhole tool
- temperature downhole
- tool
- temperature
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V8/00—Prospecting or detecting by optical means
- G01V8/02—Prospecting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V3/00—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation
- G01V3/18—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation specially adapted for well-logging
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Optics & Photonics (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Remote Sensing (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Geology (AREA)
- Environmental & Geological Engineering (AREA)
- Engineering & Computer Science (AREA)
- Semiconductor Lasers (AREA)
- Earth Drilling (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/837,692 US7638761B2 (en) | 2007-08-13 | 2007-08-13 | High temperature downhole tool |
PCT/US2008/072494 WO2009023526A1 (en) | 2007-08-13 | 2008-08-07 | High temperature downhole tool |
Publications (1)
Publication Number | Publication Date |
---|---|
BRPI0816242A2 true BRPI0816242A2 (pt) | 2016-07-19 |
Family
ID=40351078
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BRPI0816242A BRPI0816242A2 (pt) | 2007-08-13 | 2008-08-07 | ferramenta de fundo de poço de alta temperatura |
Country Status (5)
Country | Link |
---|---|
US (1) | US7638761B2 (pt) |
BR (1) | BRPI0816242A2 (pt) |
GB (1) | GB2464431B (pt) |
NO (1) | NO344094B1 (pt) |
WO (1) | WO2009023526A1 (pt) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7720323B2 (en) * | 2004-12-20 | 2010-05-18 | Schlumberger Technology Corporation | High-temperature downhole devices |
WO2011109782A1 (en) | 2010-03-04 | 2011-09-09 | Altarock Energy, Inc. | Colloidal-crystal quantum dots as tracers in underground formations |
US8952319B2 (en) * | 2010-03-04 | 2015-02-10 | University Of Utah Research Foundation | Downhole deployable tools for measuring tracer concentrations |
US8726725B2 (en) | 2011-03-08 | 2014-05-20 | Schlumberger Technology Corporation | Apparatus, system and method for determining at least one downhole parameter of a wellsite |
CN102900397B (zh) * | 2012-10-24 | 2015-04-08 | 中国石油天然气股份有限公司 | 一种井下半导体制冷装置 |
US9249656B2 (en) | 2012-11-15 | 2016-02-02 | Baker Hughes Incorporated | High precision locked laser operating at elevated temperatures |
US9441480B2 (en) | 2013-10-03 | 2016-09-13 | Baker Hughes Incorporated | Wavelength-selective, high temperature, near infrared photodetectors for downhole applications |
WO2016076824A1 (en) | 2014-11-10 | 2016-05-19 | Halliburton Energy Services, Inc. | Energy detection apparatus, methods, and systems |
US9885591B2 (en) * | 2016-03-18 | 2018-02-06 | Baker Hughes, A Ge Company, Llc | Low etendue light source for fiber optic sensors in high temperature environments |
US10620429B2 (en) * | 2017-08-30 | 2020-04-14 | Abl Ip Holding Llc | Electrowetting with compensation for force that may otherwise cause distortion or aberration |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4791636A (en) | 1985-10-30 | 1988-12-13 | Sharp Kabushiki Kaisha | Semiconductor laser device and a method for driving the same |
US5406574A (en) | 1991-10-23 | 1995-04-11 | Kabushiki Kaisha Toshiba | Semiconductor laser device |
JPH09318918A (ja) | 1996-05-29 | 1997-12-12 | Nec Corp | 半導体光変調器 |
US5805624A (en) | 1996-07-30 | 1998-09-08 | Hewlett-Packard Company | Long-wavelength infra-red vertical cavity surface-emitting laser on a gallium arsenide substrate |
US6943235B1 (en) * | 1999-04-12 | 2005-09-13 | Agensys, Inc. | Transmembrane protein expressed in prostate cancer |
US20040011950A1 (en) | 2002-05-31 | 2004-01-22 | Harkins Gary O. | Parameter sensing apparatus and method for subterranean wells |
JP3854560B2 (ja) | 2002-09-19 | 2006-12-06 | 富士通株式会社 | 量子光半導体装置 |
US7782460B2 (en) * | 2003-05-06 | 2010-08-24 | Baker Hughes Incorporated | Laser diode array downhole spectrometer |
US7196786B2 (en) | 2003-05-06 | 2007-03-27 | Baker Hughes Incorporated | Method and apparatus for a tunable diode laser spectrometer for analysis of hydrocarbon samples |
US20070081157A1 (en) | 2003-05-06 | 2007-04-12 | Baker Hughes Incorporated | Apparatus and method for estimating filtrate contamination in a formation fluid |
US7282732B2 (en) | 2003-10-24 | 2007-10-16 | Stc. Unm | Quantum dot structures |
US7279678B2 (en) | 2005-08-15 | 2007-10-09 | Schlumber Technology Corporation | Method and apparatus for composition analysis in a logging environment |
US20080245960A1 (en) * | 2007-04-09 | 2008-10-09 | Baker Hughes Incorporated | Method and Apparatus to Determine Characteristics of an Oil-Based Mud Downhole |
-
2007
- 2007-08-13 US US11/837,692 patent/US7638761B2/en not_active Expired - Fee Related
-
2008
- 2008-08-07 BR BRPI0816242A patent/BRPI0816242A2/pt not_active IP Right Cessation
- 2008-08-07 GB GB1002586A patent/GB2464431B/en not_active Expired - Fee Related
- 2008-08-07 WO PCT/US2008/072494 patent/WO2009023526A1/en active Search and Examination
-
2010
- 2010-03-11 NO NO20100345A patent/NO344094B1/no not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US20090045814A1 (en) | 2009-02-19 |
NO344094B1 (no) | 2019-09-02 |
GB201002586D0 (en) | 2010-03-31 |
US7638761B2 (en) | 2009-12-29 |
WO2009023526A1 (en) | 2009-02-19 |
NO20100345L (no) | 2010-05-14 |
GB2464431A (en) | 2010-04-21 |
GB2464431B (en) | 2011-11-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] | ||
B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |
Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2474 DE 05-06-2018 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013. |