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Vanhala et al., 1993 - Google Patents

Paper web quality profile analysis tool based on artificial neural networks

Vanhala et al., 1993

Document ID
18144734008861160746
Author
Vanhala J
Pakarinen P
Kaski K
Publication year
Publication venue
Proceedings of 1993 IEEE Conference on Tools with Al (TAI-93)

External Links

Snippet

In order to guarantee the uniform quality of paper across the whole cross-direction of the paper machine, online measurements and control equipment related to different paper quality profiles are necessary. In modern paper machines, only the basis weight, the …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by the preceding groups
    • G01N33/34Investigating or analysing materials by specific methods not covered by the preceding groups paper
    • G01N33/346Investigating or analysing materials by specific methods not covered by the preceding groups paper paper sheets

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