Nothing Special   »   [go: up one dir, main page]

Sørensen et al., 2020 - Google Patents

Recent features in EBSD, including new trapezoidal correction for multi-mapping

Sørensen et al., 2020

View PDF
Document ID
8073024780575328945
Author
Sørensen B
Hjelen J
Ånes H
Breivik T
Publication year
Publication venue
IOP conference series: Materials science and engineering

External Links

Snippet

EBSD (electron backscatter diffraction) of geological samples can be a challenge due to the complex crystal structures of minerals and commonly 5 or more different minerals in the samples. This poses a big challenge as the EBSP (electron backscatter diffraction patterns) …
Continue reading at iopscience.iop.org (PDF) (other versions)

Similar Documents

Publication Publication Date Title
Sneddon et al. Transmission Kikuchi diffraction in a scanning electron microscope: A review
Trimby Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope
Wright et al. Electron imaging with an EBSD detector
EP2866245B1 (en) Method of examining a sample in a charged-particle microscope
Humphreys et al. Orientation averaging of electron backscattered diffraction data
Sørensen et al. Recent features in EBSD, including new trapezoidal correction for multi-mapping
Brough et al. Optimising the angular resolution of EBSD
Kiss et al. Highlighting material structure with transmission electron diffraction correlation coefficient maps
Brodu et al. On-axis TKD for orientation mapping of nanocrystalline materials in SEM
Lafond et al. Electron CHanneling ORientation Determination (eCHORD): An original approach to crystalline orientation mapping
Wu et al. Automatic determination of recrystallization parameters based on EBSD mapping
Trimby et al. Microstructural imaging techniques: a comparison between light and scanning electron microscopy
Saada et al. Sub-boundaries induced by dislocational creep in uranium dioxide analyzed by advanced diffraction and channeling electron microscopy
Jablon et al. Subgrain structure and dislocations in WC-Co hard metals revealed by electron channelling contrast imaging
Britton et al. Space rocks and optimising scanning electron channelling contrast
Nolze et al. About the reliability of EBSD measurements: Data enhancement
Kang Qualities of electron backscatter diffraction patterns and image contrast from a ferritic-martensitic steel microstructure
Stegmann et al. Characterization of barrier/seed layer stacks of Cu interconnects by electron tomographic three-dimensional object reconstruction
Fullwood et al. Microstructure detail extraction via EBSD: An overview
Kopeček et al. Analysis of polycrystalline microstructure of AlMgSc alloy observed by 3D EBSD
Pilchak et al. Using cross‐correlation for automated stitching of two‐dimensional multi‐tile electron backscatter diffraction data
Shekhar et al. Electron Backscatter Diffraction Technique: Fundamentals to Applications
Wang et al. Improving orientation mapping by enhancing the diffraction signal using Auto-CLAHE in precession electron diffraction data
CN114609167A (en) Imaging method of crystal face diffraction contrast based on electron back scattering diffraction pattern
Wright et al. HIGH-SPEED EBSD.