Abstract
The increasing complexity of digital systems makes designers begin to design using abstract system level modeling (SLM). However, SLM brings new challenges for verification engineers to guarantee the functional equivalence between SLM specifications and lower-level implementations such as those of transaction level modeling (TLM). This paper proposes a novel method for equivalence checking between SLMand TLM based on coverage directed simulation. Our method randomly simulates an SLM model and uses an satisfiability modulo theories (SMT) solver to generate stimuli for the uncovered area with the direction of a composite coverage metric (code coverage and functional coverage). Then we run all the generated stimuli (random stimuli and direct stimuli) on both SLM and TLM designs. At the same time, the selected observation variables are compared to evaluate the equivalence between SLM and TLM. Promising experimental results show that our equivalence checking method is more efficient with lower simulation cost.
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Jian Hu is a PhD Candidate in computer science from the National University of Defence Technology (NUDT), China, from where he received both his BS and MS in computer science in 2009 and 2012, respectively. His research interests include computer aided design, formal verification, and equivalence checking in high level design.
Tun Li is an associate professor in College of Computer, National University of Defence Technology, China, from where he received his BS,MS and PhD in computer science. His research interests include microprocessor design and verification, parallel simulation, and computer aided design.
Sikun Li is a professor in the College of Computer, National University of Defense Technology, China. His research interests include VLSI design methodology, virtual reality technology, and computer aided design.
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Hu, J., Li, T. & Li, S. Equivalence checking between SLM and TLM using coverage directed simulation. Front. Comput. Sci. 9, 934–943 (2015). https://doi.org/10.1007/s11704-015-4257-0
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DOI: https://doi.org/10.1007/s11704-015-4257-0