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Abstract: This paper focusses on variability analysis for analyzing the robustness of self-timed SRAM to random process variations.
This paper focusses on variability analysis for analyzing the robustness of self-timed SRAM to random process variations. The paper augments our previously ...
A new self-timed 10T SRAM cell with bit line keepers developed to improve robustness in order to work in a wide range of Vdds down to 0.3V under PVT ...
The most efficient power saving method in digital systems is to scale Vdd, owing to the quadratic dependence of dynamic power consumption.
Missing: Variability | Show results with:Variability
In order to reduce the variability we need to add more RC component in to the self-time path. Normally, to hold the delay variations of the bit line swing to.
Dec 16, 2011 · Robust SRAM design is one of the key challenges of process technology scaling. The steady pace of process technology scaling allows doubling ...
This paper focusses on variability analysis for analyzing the robustness of self-timed SRAM to random process variations. The paper augments our previously ...
need for DPL variation aware SRAM robustness analysis and optimization ... variance of Vread or write time distribution curve, given the mean and ...
This paper is presenting a self-time circuit method which will improve the yield at faster process corner at the same time it will not impact the memory access ...
Abstract. Many components of variability become larger percentage design factors with decreasing feature size. Hence, the small transistors in SRAM cells ...