The paper discusses a case study on real silicon comparing the performance estimation using functional test patterns and the TF based approach on a 28nm FD-SOI ...

Section III proposes the new approach of performance estimation using transition fault test patterns. Evaluation of the proposed approach is presented in ...

To overcome those limitations, in this paper we propose an alternative solution using transition fault (TF) test patterns, which is able to eliminate the need ...

The paper discusses a case study on real silicon comparing the performance estimation using functional test patterns and the TF based approach on a 28nm FD-SOI ...

Abstract—Adaptive voltage scaling (AVS) has been used widely to compensate for process, voltage, and temperature vari- ations as well as power optimization ...

Using transition fault test patterns for cost effective offline performance estimation. Conference Paper. Apr 2017. Mahroo Zandrahimi ...

Abstract—Adaptive voltage scaling (AVS) has been used widely to compensate for process, voltage, and temperature vari- ations as well as power optimization ...

This quantitative component of assessment offers an analogue scale of performance estimation. By this means alternative design strategies can be decisively ...

To overcome those limitations, in this paper we propose an alternative solution using transition fault test patterns, which is able to eliminate the need for ...

Using transition fault test patterns for cost effective offline performance estimation. M Zandrahimi, P Debaud, A Castillejo, Z Al-Ars.