Experimental results demonstrate that a fair comparison of different test strategies requires several coverage metrics, corresponding to different delay fault ...

Experimental results demonstrate that a fair comparison of different test strategies requires several coverage metrics, corresponding to different delay fault ...

Experimental results demonstrate that a fair comparison of different test strategies requires several coverage metrics, corresponding to different delay ...

defects make the circuit under test fail to operate in the designed time. • Temporal defects are usually revealed as a longer delay of a gate or a path.

Sep 23, 1994 · tests for gate delay faults: how different they are. Pages 310 - 315 ... The path delay fault model captures small extra delays, such that ...

A hazard-free test for path p is a two pattern delay test where, for all gates lying on p, the inputs of the gates not lying on p are subject to.

Both a transition fault and a path delay fault are detected by a two-pattern test <p1, p2>. For a transition fault, the first pattern p1 assigns the initial ...

For each combinational path in a circuit, there are two path-delay faults cor- responding to rising and falling transitions, respectively. These faults for a ...

Taking advantages of both delay fault models (simplicity of the transition faults testing and quality of path delay faults testing) new models have been defined ...

At- speed test, which significantly increases the delay fault coverage, is used in industrial applications. The transition fault model, which is the simplest ...