This paper introduces a systematic approach for partitioning a given deterministic test-set into subsets so that the reproduction time is minimized.

Test-set partitioning for multi-weighted random LFSRs.

The basic partitioning criterion is the maximum Hamming distance between any two test patterns in the same set. The number of test patterns within each subset ...

This paper introduces a systematic approach for partitioning a given deterministic test-set into subsets so that the reproduction time is minimized. It presents ...

The basic partitioning criterion is the maximum Hamming distance between any two test patterns in the same set. The number of test patterns within each subset ...

Apr 18, 2024 · Dimitri Kagaris, Spyros Tragoudas, Amitava Majumdar: Test-set partitioning for multi-weighted random LFSRs. Integr. 30(1): 65-75 (2000).

Test-set partitioning for multi-weighted random LFSRs. Kagaris, D.; Tragoudas, S.; Majumdar, A. Integration (Amsterdam) 30(1): 65-75. 2000. ISSN/ISBN: 0167 ...

The basic partitioning criterion is the maximum Hamming distance between any two test patterns in the same set. The number of test patterns within each subset ...

... multiple weight-sets, one weight-set per subset, are generated for efficient Weighted Random LFSR Test Pattern Generation. The basic partitioning criterion ...

Tragoudas, A. Majumdar, "Test-Set Partitioning for Multi-Weighted Random LFSRs," Integration, the VLSI Journal, vol. 30, pp. 65-75 ...