Experimental results show that the proposed test application scheme can efficiently reduce test power, compress test stimulus data, and compact test response ...

This paper presents an efficient technique to reduce test data volume and test power simultaneously.

We present a selective encoding method that reduces test data volume and test application time for scan testing of In- tellectual Property (IP) cores.

Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data. Dong Xiang Zhen Chen. Published in: Asian Test Symposium (2011).

A new test application scheme is proposed for low-power scan testing, which is able to compress test data significantly. A combination of a scan architecture ...

A new scan architecture for both low power testing and test volume compression is proposed. For low power test requirements, only a subset of scan cells is ...

the proposed low-power scan testing scheme can be compatible with the selective encoding scheme. a DFT based clock disabling scheme is proposed to reduce ...

A selective encoding method that reduces test data volume and test application time for scan testing of intellectual property (IP) cores and derives a ...

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Abstract—Test data decompressors targeting low power scan testing introduce significant amount of correlation in the test data.