By applying a transformed circuit and a new fault list to an existing Automatic Test Pattern Generation (ATPG) tool, we generate the compressed test patterns ...

Volume diagnosis plays an important role in the yield learning process. To get a high quality diagnosis result, patterns with high distinguishability.

The basic idea is to transform all fault pairs into stuck-at-faults in the modified circuit model such that all of them can be dealt with by the ATPG tool ...

Bibliographic details on Substantial Fault Pair At-a-Time (SFPAT): An Automatic Diagnostic Pattern Generation Method.

This paper aims at improving the precision with which a fault is identified by removing any ambiguity between a bridging fault and a stuck-at fault.

Substantial fault pair at-a-time (SFPAT): An automatic diagnostic pattern generation method. In Proceedings of the Asian Test Symposium. IEEE, 192--197 ...

A diagnostic test generation system · Substantial Fault Pair At-a-Time (SFPAT): An Automatic Diagnostic Pattern Generation Method · Exclusive test and its ...

Substantial fault pair at-a-time. (SFPAT): An automatic diagnostic pattern generation method. 19th Institute. Electrical and Electronics Engineers (IEEE) ...

Substantial Fault Pair At-a-Time (SFPAT): An Automatic Diagnostic Pattern Generation Method ... “…But the number of test patterns also grows with increasing N , ...

To obtain smaller, and more accurate, sets of candidate faults, a diagnostic test generation procedure produces a test set that distinguishes fault pairs. This ...