This paper proposes a statistical methodology to bring the process variation effects from transistor level up to system level in terms of circuit delay. A cell ...

This paper proposes a statistical methodology to bring the process variation effects from transistor level up to system level in terms of circuit delay. A cell ...

This paper proposes a statistical methodology to bring the process variation effects from process level up to system level in terms of circuit leakage power ...

Pre-silicon delay models are foundations of all variants of delay testing for the above post-silicon tasks, since these tasks use pre-silicon models to select/ ...

This thesis presents a new method for mathematically modeling and reducing variation in manufacturing systems. While this domain has traditionally been the ...

Mar 15, 2024 · This study provides an overview of data-driven methods for estimating time lags between sensors in continuous processes.

In this paper, we review various statistical methodolo- gies that have been recently developed to model, analyze, and optimize performance variations at both ...

Statistical modelling and analysis approaches have been widely used to reflect the effects of a variety of variational process parameters on system performance ...

Section 6.4 overviews the circuit analysis approaches that are used to evaluate and guard against variation, including random, spatial, and worst-case analyses.

This chapter discusses the following four key elements of process variations and statistical modeling necessary for integrated circuit design: parametric ...