Oct 20, 2022 · This article conducts a systematic study over reliability issues caused by open blocks, and reports several new observations.
To address the reliability issues of open blocks, this paper first proposes to adaptively allocate active blocks to serve write requests based on the workload.
We aim to enhance 3D NAND flash memory by systematically reducing the spacer length (Ls) and gate length (Lg) to achieve improved memory characteristics. Using ...
Duration: 1:01
Posted: Sep 28, 2022
Posted: Sep 28, 2022
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Resolving the Reliability Issues of Open Blocks for 3-D NAND Flash: Observations and Strategies. Li, Q., Ye, M., Cui, Y., Ren, T., Kuo, T., & Xue, C. J. IEEE ...
For reliability and other reasons, the technology node in 3D NAND SSD is larger than in 2D, but data density can be increased via increasing bit-per-cell. In ...
Open block characterization and read voltage calibration results of state-of-the-art 3D QLC NAND are presented and the reliability issues with open blocks ...
Resolving the Reliability Issues of Open Blocks for 3-D NAND Flash: Observations and Strategies · Engineering, Materials Science. IEEE Transactions on Computer- ...
As a result, reducing error bits is an effective solution to further improve the reliability of flash drives when a specific ECC is adopted in the flash drive.
We review the state-of-the-art in the understanding of planar NAND Flash memory reliability and discuss how the recent move to three-dimensional (3D) devices ...
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