Sep 1, 2014 · This study presents a systematic defect diagnosis to identify 'culprit physical features' that are potentially responsible for yield loss.
Abstract: This study presents a systematic defect diagnosis to identify 'culprit physical features' that are potentially responsible for yield loss. A 'single ...
This study presents a systematic defect diagnosis to identify 'culprit physical features' that are potentially responsible for yield loss and a ' single ...
This study presents a systematic defect diagnosis to identify 'culprit physical features' that are potentially responsible for yield loss.
Physical‐aware systematic multiple defect diagnosis ... Authors: Po‐Juei Chen; Chieh‐Chih Che; James C.‐M. Li; Shuo‐Fen Kuo; Pei‐Ying Hsueh ...
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This paper describes a comprehensive methodology that addresses the prevention and identification of systematic defects. For prevention, a method called RADAR ( ...
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This paper describes a three-phase, physically-aware diagnosis methodology called MD-. LearnX to effectively diagnose multiple defects, and in turn, aid in ...
in diagnosis, this experiment is performed for two scenarios: ideal and actual diagnosis. Ideal diagnosis means that diagnosis correctly pinpoints the ...
[18] W. C. Tam and R. D. Blanton, “Physically-aware analysis of systematic defects in integrated circuits,” in Test Conference (ITC), 2011 IEEE ...
Novel techniques to identify and prevent design-induced systematic defects are developed, which facilitate to evaluate the effectiveness of DFM rules and ...
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