Presents a built-in-self test (BIST) technique to implement the parallel approach for testing multi-port memories.

This paper presents a novel approach for testing multi-port memories. This approach is based on the parallel execution of the testing process so that ...

This paper presents a Built-In-Self Test (BIST) technique to implement the parallel approach for testing multi-port memories introduced in [1]. This approach is ...

This paper presents a Built-In-Self Test (BIST) technique to implement the parallel approach for testing multi-port , memories introduced in [1].

Contents. DFT '01: Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems. Parallel Testing of Multi-port Static ...

This paper presents a novel approach for testing multi-port memories. This approach is based on the parallel execution of the testing process so that ...

This paper presents a Built-In-Self Test (BIST) technique to implement the parallel approach for testing multi-port, memories introduced in [1].

This paper presents a novel approach for testing multiport memories. This approach is based on the parallel execution of the testing process so that ...

A built-in-self test (BIST) technique to implement the parallel approach for testing multi-port memories so that inter-port faults can be detected at no ...

A method for and apparatus of testing a multi-port RAM (random access memory) detect single port faults and inter port shorts in multi-port random access ...