We propose a new coverage metric for delay fault tests. The coverage is measured for each line with a rising and a falling transition, ...
Abstract—We propose a new coverage metric for delay fault tests. The coverage is measured for each line with a rising and a falling transition,.
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What is path delay fault?
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What is path fault?
We propose a new coverage metric for delay fault tests. The coverage is measured for each line with a rising and a falling transition, ...
The line delay model, on the other hand, retains many advantages of the transition and gate delay fault models, while allevi- ating the major drawback of the ...
... fault on line k in a logic circuit. Then all path delay faults through line Ic (and hence the line delay fault on line k) for which a rising (falling) ...
Propagation delays of all paths in a circuit must be less than the clock period for correct operation. ○ Functional tests applied at the operational speed.
Abstract. The path delay fault model is the most realistic model for delay faults. Testing all the paths in a circuit achieves. 100% delay fault coverage ...
The main difference between the transition and path delay faults testing is the fault coverage quality in relation to the delay size.
A theorem stating that a redundant stuck-at fault makes all path delay faults involving the faulty line untestable for either a rising or falling transition ...
Different from the transition fault model which only captures single large delay at a specific line, the path delay fault model captures small extra delays ...