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Low-power FinFET technologies pose new challenges for latch-up safe design. Downscaling of the feature size causes significant drop of the trigger current.
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FinFET technology compared with planar have an increased sensitivity to single-event latch-up. TCAD simulation demonstrates that the reduction in width of ...
Low-power FinFET technologies pose new challenges for latch-up safe design. Downscaling of the feature size causes significant drop of the trigger current ...
This paper illustrates advanced latch-up verification challenges associated with 2.5D/3D ICs, especially for external and mixed-voltage rules.
Abstract—Low-power FinFET technologies pose new challenges for latch-up safe design. Downscaling of the feature size causes significant drop of the trigger ...
Latch-up and ESD are not serious reliability issues in IC design industry. The detection of latch-up vulnerability as well as ESD prevention have been ...
In this paper, Internal Latchup (ILU) behaviors are studied in an advanced bulk FinFET technology. The methodology of the ILU development and characterization ...
Aug 31, 2020 · Supply-voltage spikes causing latch-up, which may increase the local die temperature and subsequently lead to the thermal runaway, are well ...
Nov 28, 2023 · Well contacts: Another type of latch-up structurefor intentionally disrupting latch-up paths between power supply rails. Heat sinks: Reduces ...
Dec 30, 2021 · A sustained latch-up event happens when the supply voltage (VDD) is higher than the Vh of the parasitic SCR structure because the VDD is high ...