Apr 1, 2014 · Introduction to Special Issue on Cross-layer Dependable Embedded Systems · Contents. ACM Transactions on Embedded Computing Systems (TECS).
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Improvements in chip manufacturing technology have propelled an astonishing growth in embedded systems that are integrated into our daily lives.
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This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems.
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This work presents five recent approaches for application-aware cross-layer reliability optimization from within the embedded domain. Moreover, the ...
This Series addresses current and future challenges pertaining to embedded hard- ware, software, specifications and techniques. Titles in the Series cover a ...
We study in detail their relationships to classical formalisms such as pushdown systems, Petri nets, F ifo systems, and counter systems. Our main technical ...
This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged.
Jun 8, 2015 · This Special Issuereports the newest trends and re-sults from the DFG SPP 1500 “Dependable Embedded Sys-tems” and the NSF “Variability ...
Details ; Title. Introduction to: Special Issue on Cross-Layer System Design ; Author. Sato, Takashi ; Is Part Of. ACM journal on emerging technologies in ...
Missing: Dependable Embedded
Oct 2021: Our Special Issue on Cross-Layer Design of Cyber-Physical Systems in IEEE Design & Test is now available. See introduction to the special issue [pdf]