Abstract: Error-resilience is related to the capability of a compressed test data stream (which is transferred from an automatic test equipment (ATE) to the ...
Abstract: Error-resilience is related to the capability of a compressed test data stream (which is transferred from an automatic test equipment (ATE) to the ...
Improving Error Resilience for Compressed Test Sets by Don't Care Assignment. Hashempour H., Lombardi F. Expand. Publication type: Proceedings Article. —. DOI ...
This paper addresses error-resilience as the capability to tolerate bit-flips in a compressed test data stream (which is transferred from an automatic test ...
This paper presents a novel technique for achieving error-resilience to bit-flips in compressed test data streams. Error-resilience is related to the ...
This work investigates the application of Huffman codes to pattern encoding and demonstrates the feasibility of this approach by applying it to SSL test ...
Improving Error Resilience for Compressed Test Sets by Don't Care AssignmentHamidreza Hashempour, Fabrizio Lombardi. 65-68 [doi] · Hybrid test data compression ...
Abstract—This paper presents a built-in soft error resilience. (BISER) technique for correcting radiation-induced soft errors in latches and flip-flops.
[PDF] Embedded Deterministic Test for Systems-On-A-Chip - MacSphere
macsphere.mcmaster.ca › bitstream
Embedded deterministic test (EDT) is a manufacturing test paradigm that combines the compression advantage of built-in self-test with the high fault ...
The comprehensive review of future test technology trends, including self- repair, soft error protection, MEMS testing, and RF testing, leads students and ...