Since 2001 the IEEE P1581 working group aims to provide a test standard for memories that cannot have boundary scan. Currently this P1581 activity focuses ...
Since 2001 the IEEE P1581 working group aims to provide a test standard for memories that cannot have boundary scan. Currently this P1581 activity focuses ...
This paper elaborates on the status of the draft standard. It describes the test circuitry and an economic model for users of P1581 devices is presented.
IEEE P1581: to live or let die? Conference Paper. Jan 2003. Frans de Jong · Leon ... High performance data processing in Josephson technology. March 1982 · IEEE ...
IEEE P1581: To Live or Let die? F. JongL. V. D. Logt. Computer Science, Economics. International Test Conference. 2003. TLDR. The test circuitry and an economic ...
IEEE P1581: To Live or Let die? Frans de Jong ,. Leon van de Logt. ConferenceInternational Test Conference, 2003. Proceedings. ITC 2003 ...
The proposed solution. The proposed IEEE P1581 aims to develop a standard method for testing low-cost, complex DDR memory devices, which would be able to ...
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https://dblp.org/rec/conf/itc/JongL03 · Frans G. M. de Jong, Leon van de Logt: IEEE P1581: To Live or Let die? ITC 2003: 1278. [+][–]. Coauthor network.
, Leon van de Logt: IEEE P1581: To Live or Let die? 1278. Electronic Edition (link) BibTeX. How (In) Adequate is One-Time Testing? Rubin A. Parekhji: Panel ...
IEEE P1581: To Live or Let die? pp. 1278. Panel Synopsis - How (In)Adequate is One Time Testing? pp. 1279. Should Nanometer Circuits be Periodically Tested in ...