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This paper shows that existing delay-based testing techniques for power gating exhibit fault coverage loss due to unconsidered delays introduced by the ...
PDF | This paper shows that existing delay-based testing techniques for power gating exhibit fault coverage loss due to unconsidered delays introduced.
Abstract—This paper shows that existing delay-based testing techniques for power gating exhibit fault coverage loss due to unconsidered delays introduced by ...
This paper shows that existing delay-based testing techniques for power gating exhibit fault coverage loss due to unconsidered delays introduced by the ...
This paper shows that existing delay-based testing techniques for power gating exhibit fault coverage loss due to unconsidered delays.
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The goal of this paper is to study and implement low power designs and create environment around design suitable for testing the logic.
High Quality Testing of Grid Style Power Gating. Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ats/TenentesKAZY14. Home | Example ...
▫ Design worst-case power gate and grid resistance to meet specification target. ▫ Analyze drop at highest operating voltage and highest power consumption.
It has been shown that the Power Gating technique uses high Vt sleep transistors. When the block is not switching high sleep transistors are cut off VDD from a ...
Missing: Testing | Show results with:Testing
We showed that delay-based testing of power switches must consider a power distribution network (PDN) model in order to avoid fault coverage loss and yield ...