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GRAPH PARTITIONING FOR CONCURRENT TEST SCHEDULING. IN VLSI CIRCUIT. Chien-In Henry Chen. Department of Electrical Engineering. Wright State University. Dayton ...

Some of the techniques in current use exploit parallelism in testing VLSI circuits, but the computation ... The problem of concurrent test scheduling is mapped ...

Graph partitioning for concurrent test scheduling in VLSI circuit. Published in: 28th ACM/IEEE Design Automation Conference. Article #:. Date of Conference: 17 ...

This work presents a heuristic solution, called Weighted Cluster Partitioning (WCP), to the problem of long testing time for VLSI circuits, which is a more ...

Our solution is a more efficient and effective procedure which explores the space of concurrent test schedule and leads to a considerable reduction of testing ...

Graph Partitioning for Concurrent Test Scheduling in VLSI Circuit ... Graph Partitioning for Concurrent Test Scheduling in VLSI Circuit DAC, 1991 ...

Bibliographic details on Graph Partitioning for Concurrent Test Scheduling in VLSI Circuit.

The tutorial introduces the partitioning with applications to VLSI circuit designs. The problem formulations include two-way, multiway, and multi-level ...

Given a graph G = (V,E), where nodes represent data or tasks and edges represent communication, the goal is to divide V into equal sized parts V1,...,Vk while ...