In this paper, the problem of nondeterminism in the output response of the device-under-test (DUT) is described. This can arise due to limited automated test ...
Eliminating Non-Determinism During Test of High-Speed Source. Synchronous Differential Buses. Kartik Mohanram and Nur A. Touba. Computer Engineering Research ...
In this paper, the problem of non-determinism in the output response of thedevice-under-test (DUT) is described. This can arise dueto limited automated test ...
In this paper, the problem of nondeterminism in the output response of the device-under-test (DUT) is described. This can arise due to limited automated test ...
Mohanram and N.A. Touba, "Eliminating Non-Determinism During Test of High-. Speed Source Synchronous Differential Buses", Proc. of IEEE VLSI Test Symposium,.
Mohanram and N. A. Touba, “Eliminating non-determinism during test of high-speed source synchronous differential buses,” in VTS '03: Proceedings of the 21st ...
A general method to eliminate the nondeterminism resulted from clock domain crossing and to adapt to various clock conditions, an automatic configuration ...
Testing Buses and On-Chip Interconnect. Kartik Mohanram, Nur A. Touba: Eliminating Non-Determinism During Test of High-Speed Source Synchronous Differential ...
Eliminating non-determinism during test of high-speed source synchronous differential buses. In Proceedings. 21st VLSI Test Symposium, 2003., 1 and 2, (pp.
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Eliminating Non-Determinism During Test of High-Speed Source Synchronous Differential Buses pp. 121. The Impact of NoC Reuse on the Testing of Core-based ...