We give the first subexponential time deterministic polynomial identity testing algorithm for depth-4 multilinear circuits with a small top fan-in.
We give the first sub-exponential time deterministic polynomial identity testing algorithm for depth-4 multilinear circuits with a small top fan-in.
Nov 15, 2009 · Abstract. We give the first sub-exponential time deterministic polynomial identity testing algorithm for depth-4 multilinear circuits with a ...
We give the first sub-exponential time deterministic polynomial identity testing algorithm for depth-4 multilinear circuits with a small top fan-in.
For depth-4 multilinear circuits with bounded fan in top gate, our result provided the first efficient identity testing algorithm. This result was improved ...
We give the first subexponential time deterministic polynomial identity testing algorithm for depth-4 multilinear circuits with a small top fan-in.
We give the first subexponential time deterministic polynomial identity testing algorithm for depth-4 multilinear circuits with a small top fan-in.
Apr 22, 2023 · Title:Deterministic identity testing paradigms for bounded top-fanin depth-4 circuits. Authors:Pranjal Dutta, Prateek Dwivedi, Nitin Saxena.
Missing: Multilinear | Show results with:Multilinear
Request PDF | On Jan 1, 2009, Zohar Shay Karnin and others published Deterministic identity testing of depth 4 multilinear circuits with bounded top fan-in.
Abstract: We give the first sub-exponential time deterministic polynomial identity testing algorithm for depth-4 multilinear circuits with a small top ...