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Abstract: An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described.
Abstract: An optimization algorithm for the design of combi- national circuits that are robust to single-event upsets (SEUs) is described.
Abstract: An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described.
Abstract. An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described.
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate ...
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate ...
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A sim- ple, highly accurate ...
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate ...
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Abstract: An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described.
Bibliographic details on Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques.