Abstract: A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented.

This paper presents a low cost DFT methodology which can enable application of desired test patterns to the circuit input. We begin by a discussion of existing ...

A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is pre- sented. The proposed technique increases ...

W.-C. Fang and S. K. Gupta. Clock Grouping: A Low Cost DFT Methodology for Delay Testing. Technical Report 94-04, University of Southern California, 1994.

A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented and can provide a DFT solution for ...

A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases ...

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Clock Grouping: A Low Cost DFT Methodology for Delay Testing DAC, 1994. DAC 1994 · DBLP · Scholar · DOI. Full names. Links ISxN. @inproceedings{DAC-1994-FangG ...

This page shows the traffic from major research institutions for Clock Grouping: A Low Cost DFT Methodology for Delay Testing on Sciweavers sorted by most ...

DFT techniques for making it possible to test hard-to-probe ICs using JTAG Boundary Scan, resulting in faster, lower cost manufacturing test.