This paper investigates the impact of faults affecting the clock distribution network of synchronous systems on manufacturing testing.
This paper investigates the impacr of faults affecting the clock distribution nehvork of synchronous systenis on manu- facturing testing.
Investigation of the impact of faults affecting the clock distribution network of synchronous systems on manufacturing testing shows that clock faults can ...
This paper investigates the impact of faults affecting the clock distribution network of synchronous systems on manufacturing testing.
This paper investigates the impact of faults affecting the clock distribution network of synchronous systems on manufacturing testing.
We can expect that their effect on the operation of a system may be catastrophic (i.e., the system will crash), thus easily detectable. In [15] we have ...
In particular, we have found that the clock faults can be detected during manufacturing testing in only 12 percent of cases. Even more surprisingly, we have ...
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In this paper, we conduct a study on whether a fault can be detected by specific code coverage in automated test generation.
Solution: test the longest path through every node. This will detect the smallest possible delay increase which will cause the circuit to fail. Total number ...
We propose a new design for testability approach for testing clock faults of next generation high performance microprocessors. In fact, it has been shown ...