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Dec 6, 2007 · This paper presents a built-in self-test (BIST) architecture for testing high-speed analog-to-digital converters (ADCs) with sampling rates ...
Abstract—This paper presents a built-in self-test (BIST) ar- chitecture for testing high-speed analog-to-digital converters.
A Fully Integrated and Reconfigurable Architecture for Coherent Self-Testing of High Speed Analog-to-Digital Converters · Computer Science, Engineering. IEEE ...
Amplitude and time measurements for the output signal are commonly realized with Analog to Digital Converters (ADC) [19] and Time to Digital Converters (TDC) [ ...
Nov 28, 2019 · Built-in self test of high speed analog-to-digital converters ; Published in: IEEE Instrum.Measur.Mag. 22 (2019) 6, 4-10 ; DOI: 10.1109/MIM.
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This fully integrated, low cost, and reconfigurable architecture for coherent self-testing of high speed ADCs is based on two synchronized PLLs, one to ...
We have invented a built-in self test technique for an integrated circuit having an analog to digital converter. A linear ramp voltage is generated on the ...
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Abstract. This paper presents a new Built-In Self-Test for. Pipeline ADC's. The test set is divided in 3 parts: Monotonicity test for basic functionality ...
This document describes both the characterization and production test methods used by the High Speed Converter Group of Analog Devices, Inc., ...
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A built-in self-test (BIST) architecture for testing high speed analog-to-digital converters (ADCs) with sampling rates in excess of 1 GHz is presented and ...