B-XRDI is an x-ray diffraction imaging technique which allows the user to reconstruct from a series of section x-ray topographic images a full profile of the ...

B-XRDI is an x-ray diffraction imaging technique which allows the user to reconstruct from a series of section x-ray topographic images a full profile of the ...

B-XRDI is an x-ray diffraction imaging technique which allows the user to reconstruct from a series of section x-ray topographic images a full profile of the ...

B-spline X-ray diffraction imaging – rapid non-destructive measurement of die warpage in ball grid array packages ; Authors. Cowley, A.; Ivankovic, A.; Wong, C.S ...

B-Spline X-Ray Diffraction Imaging — Rapid non-destructive measurement of die warpage in ball grid array packages · Microelectronics Reliability 59: 108-116.

B-spline X-ray diffraction imaging – rapid non-destructive measurement of die warpage in ball grid array packages ; dc.contributor.imecauthor, Gonzalez, Mario.

These techniques allow for the rapid reconstruction of strain fields and lattice warpage data from x-ray diffraction images (also known as x-ray topographs) and ...

B-Spline X-Ray Diffraction Imaging techniques for die warpage and stress monitoring inside fully encapsulated packaged chips · Engineering, Materials Science.

Apr 25, 2024 · B-Spline X-Ray Diffraction Imaging - Rapid non-destructive measurement of die warpage in ball grid array packages. Microelectron. Reliab. 59 ...

B-Spline X-Ray Diffraction Imaging - Rapid non-destructive measurement of die warpage in ball grid array packages · Cowley, A; Ivankovic, A; Wong, CS; Bennett ...