PDF | In this paper, we discuss the relationship between the test generation complexity for path delay faults (PDFs) and that for stuck-at faults (SAFs).
Aug 1, 2007 · Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on τ<SUP><I>k</I></SUP>-Notation · Authors · Downloads.
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Abstract This paper introduces k-notation to be used to analyze the test generation complexity of a class of circuits with a type of faults.
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In this paper, we discuss the relationship between the test generation complexity for path delay faults (PDFs) and that for stuck-at faults (SAFs) in ...
Missing: tauk- | Show results with:tauk-
Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on tauk-Notation · C. Y. OoiT. ClouqueurH. Fujiwara. Computer Science. IEICE ...
Oct 22, 2024 · This paper introduces τ k notation to be used to assess test generation complexity of classes of sequential circuits. Using τ k notation, we ...
We present a theorem stating that a redundant stuck-at fault makes all path delay faults involving that faulty line untestable for either a rising or falling ...
Missing: tauk- | Show results with:tauk-
Acceleration of transition test generation for acyclic sequential ...
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Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on tauk-Notation · C. Y. OoiT. ClouqueurH. Fujiwara. Computer Science. IEICE ...
Aug 30, 2012 · Transition faults and path-delay are two delay-based fault models that are widely used today while performing at-speed testing. Way to do ...
In this paper, we report a tool called MODET for auto- matic test generation for path delay faults in modular com- binational circuits. Our technique uses ...