Alternate loop-back diagnostic tests for wafer-level diagnosis of modern wireless transceivers using spectral signatures | IEEE Conference Publication | IEEE ...

One possible solution for integrated RF transceivers is to loop-back the transmitted RF signal to the receiver input thereby enabling source and measure ...

Apr 30, 2006 · One possible solution for integrated RF transceivers is to loop-back the transmitted RF signal to the receiver input thereby enabling source and ...

Bibliographic details on Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures.

Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. Srinivasan G., Chatterjee A., ...

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Alternate loop-back diagnostic tests for wafer-level diagnosis of modern wireless transceivers using spectral signatures. Conference Paper. Full-text ...

Alternate loop-back diagnostic tests for wafer-level diagnosis of modern wireless transceivers using spectral signatures · G. SrinivasanA. ChatterjeeF ...

"Alternate Loop-Back Diagnostic Tests for Wafer Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures" Proceedings of the VLSI Test ...

Apr 25, 2024 · Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. VTS 2006: 222-227 ...