This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory.
This tutorial aims at introduce and guide to new test approaches developed so far for dealing with dynamic faults in the latest generation of SRAM memories.
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This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory.
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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies is written by Alberto Bosio; Luigi Dilillo; ...
This tutorial aims at introduce and guide to new test approaches developed so far for dealing with dynamic faults in the latest generation of SRAM memories. I.
Chapter 1 presents the context of this book by first proposing an overview of semiconductor memories and then giving back- ground on SRAM modeling and testing.
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled... Google Books
Originally published: October 8, 2009
Authors: Luigi Dilillo, Serge Pravossoudovitch, Arnaud Virazel, and more
Jun 16, 2024 · The challenge of testing SRAM memories consists in providing realistic fault models and test solutions with minimal application time. Due to the ...
Nov 4, 2009 · Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics.
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This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical ...
Jun 16, 2024 · The first section focuses on threshold voltage deviations within the SRAM core-cell that lead to static and dynamic faults, such as TF and dRDF.