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In this paper, a SAT-based technique is proposed to adaptively generate patterns to diagnose stuck-at faults in scan chains. Experimental results on ISCAS'89 ...
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip ...
Bibliographic details on Adaptive Diagnostic Pattern Generation for Scan Chains.
Oct 22, 2020 · The scan chain test data is analyzed in order to identify one or both of a type of defect (e.g., a timing fault, stuck-at fault, etc.) or a ...
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A system and method for performing scan chain testing is disclosed. Scan cells, in the form of scan chains, are inserted into circuit designs for testing ...
Apr 28, 2024 · In this paper we first analyze the advantages and disadvantages of each category of the chain diagnosis algorithms. Next, an adaptive signal ...
Embodiments of the disclosed technology comprise techniques that can be used to generate scan chain test patterns and improve scan chain failure diagnosis ...
A scan chain refers to a series of Scan Flip-Flops (SFFs) interconnected in a sequential circuit design to facilitate testing.
Aug 24, 2020 · This article proposes a novel scan-chain diagnosis method using regression and fan-in and fan-out filters that require shorter training and diagnosis times.
Aug 18, 2012 · The most effective way to test the scan chains, and to detect any broken scan chains, is using a dedicated 'chain test pattern' or 'chain flush' pattern.