Abstract: Diagnosis is essential in modern chip production to increase yield, and debug constitutes a major part in the pre-silicon development process.

Jul 29, 2009 · In this section, we improve the test set based on the response of the device under diagnosis. For comparison reasons, we present results for ...

Abstract— Diagnosis is essential in modern chip production to increase yield, and debug constitutes a major part in the pre- silicon development process.

Abstract— Diagnosis is essential in modern chip produc- tion to increase yield, and debug constitutes a major part in the pre-silicon development process.

A method is presented, which identifies possible faulty regions in a combinational circuit, based on its input/output behavior and independent of a fault ...

Thenew adaptive, statistical approach combines a flexible andpowerful effect-cause pattern analysis algorithm with highresolutionATPG. We show the effectiveness ...

Diagnosis is essential in modern chip production to increase yield, and debug constitutes a major part in the pre-silicon development process.

Here, the syndromes of the device under diagnosis (DUD) are examined in order to confine the set of possible suspects and to find reasonable fault candidates.

Diagnosis is essential in modern chip production toincrease yield, and debug constitutes a major part in the presilicondevelopment process.

Adaptive Debug and Diagnosis without Fault Dictionaries. Stefan Holst, Hans-Joachim Wunderlich. Adaptive Debug and Diagnosis without Fault Dictionaries.