A novel scan-based at- speed test is proposed which generates multiple local fast scan enable signals. The scan enable control information is encap- sulated in ...

A novel scan-based at-speed test is proposed which generates multiple local fast scan enable signals. The scan enable control information is encapsulated in the ...

The launch-off-shift method has several advantages over the launch-off-capture but imposes strict requirements on transition fault testing due to at-speed scan ...

A novel scan-based at-speed test is proposed which generates multiple local fast scan enable signals. The scan enable control information is encapsulated in the ...

A novel scan-based at-speed test is proposed which generates multiple local fast scan enable signals and is robust, practice-oriented and suitable for use ...

A novel scan-based at-speed test is proposed which generates multiple local fast scan enable signals. The scan enable control information is encapsulated in the ...

1) At-speed transition fault testing requires a scan enable (SEN) signal that can transition quickly between scan and capture modes. However, generating a ...

A method and/or a system of at-speed transition fault testing with low speed scan enable is disclosed. In one embodiment, a digital system includes any ...

1) At-speed transition fault testing requires a scan enable (SEN) signal that can transition quickly between scan and capture modes.

At-Speed Transition Fault Testing With Low Speed Scan Enable. Ahmed N., Ravikumar C.P., Tehranipoor M., Plusquellic J. Expand. Publication type: Proceedings ...