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Abstract: A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines ...
Abstract. A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or out-.
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines and is ...
Abstract: A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines ...
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines and is ...
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines and is ...
Next, a deductive procedure for the diagnosis of bridging faults in combinational circuits is presented. It consists of a path-trace procedure starting from ...
1997. A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines and is ...
In this paper we investigate and improve a bridg- ing fault diagnosis technique using the single stuck- ... method for simulating CMOS bridging faults in.
Missing: deductive | Show results with:deductive
Mar 25, 2024 · The proposed technique is a layout-aware diagnosis which contains bridging pair extraction, structural analysis, and layer-oriented covering.
Missing: deductive | Show results with:deductive