In the built-in testing of the IC memory, the testing efficiency can be improved by building the testing circuit into the IC memory, that can observe and/or ...
Hideo Tamamoto, Hirotomo Sakusabe, Yuichi Narita: A built-in testing scheme for ic memories by considering address decoder and cell array separately.
Hideo Tamamoto, Hirotomo Sakusabe, Yuichi Narita: A built-in testing scheme for ic memories by considering address decoder and cell array separately. Syst ...
the memory cell arrays, separate tests check the decoders, the test logic, and the I/O circuits. The memory cells are tested with the marching-test algorithm.
Oct 22, 2024 · In this paper, a built-in testing scheme is discussed in which the testing circuit is built in so that the address and the data part can be ...
A memory decoder circuit takes a requested cell address and selects a specific row (by appropriate word line) and specific column (appropriate bit line is ...
This paper presents an overview of the problem of testing semiconductor random access memories (RAMs). An important aspect of this test procedure is the ...
Missing: built- separately.
An address generator provides for generation of addresses for a plurality of different tests by allowing for primitive polynomial-based pseudo-random ...
Aug 6, 2024 · Due to rapid and continuous technology scaling, faults in semiconductor memories (and ICs in general) are becoming pervasive and weak rather ...
Missing: separately. | Show results with:separately.
Compared with typical tests for CAM cell array faults, the fault coverage of SAFs in the priority encoder is increased from 90.2% or 60.5% to 100% for a. CAM ...