The proposed receiver increases the communication distance over 4 times while providing tolerance against the distance-voltage-area variations. I. INTRODUCTION.
A high-sensitivity capacitive-coupling interface is presented for wireless wafer testing systems that increases the communication distance over 4 times ...
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A high-sensitivity capacitive-coupling receiver is presented for wireless wafer probing systems. The receiver with the optimum logic threshold (OLT) achieves ...
11. Kim, G.-S., M. Takamiya, and T. Sakurai, "A capacitive coupling interface with high sensitivity for wireless wafer testing, ...
Abstract: A high-speed, low-power capacitive-coupling transceiver is presented for wireless wafer-level testing systems. The proposed transceiver achieves the ...
A non-contact testing technique that wirelessly couples an IC wafer and ATE, and serves as an alternative to conventional probe-card testing, ...
Sep 23, 2009 · Abstract—A high-sensitivity capacitive-coupling receiver is pre- sented for wireless wafer probing systems. The receiver with the optimum ...
A Capacitive Coupling Interface with High Sensitivity for Wireless Wafer Testing ... An Innovative Die to Wafer 3D Integration Scheme: Die to Wafer Oxide or ...
Sep 27, 2020 · This paper presents a capacitive pressure sensor interface circuit design in 180 nm XH018 CMOS technology for an implantable capacitive pressure sensor.
Abstract — In this paper we present a new slot antenna with an embedded temperature sensor for remote sensing in harsh environment applications.