Aug 19, 2008 · Abstract: This paper presents a nonscan design-for-testability (DFT) method for register-transfer-level (RTL) circuits.

In this paper, we propose a DFT method for RTL controller–data path circuits to reduce the hardware overhead while achieving 100% FE for gate-level single stuck ...

This paper presents a non-scan design-for-testability (DFT) method for register transfer level (RTL) circuits. We first introduce τk-notation to analyze the ...

This paper presents a nonscan design-for-testability (DFT) method for register-transfer-level (RTL) circuits, and introduces a new class of linear-depth ...

This paper presents a nonscan design-for-testability (DFT) method for register-transfer-level (RTL) circuits. We first introduce the notation to analyze the ...

Abstract—This paper presents a non-scan design-for-testability. (DFT) method for register transfer level (RTL) circuits. We first.

This paper presents a nonscan design-for-testability (DFT) method for register-transfer-level (RTL) circuits. We first introduce the notation to analyze the ...

This paper presents a nonscan design-for-testability (DFT) method for register-transfer-level (RTL) circuits. We first introduce the notation to analyze the ...

A nonscan design-for-testability method for register-transfer-level circuits to guarantee linear-depth time expansion models. This paper presents a nonscan ...

This paper presents a non-scan design-for-testability method for register transfer level circuits. We first introduce a new testability of RTL circuits ...