Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in ...
To address the above issues, in this paper, we propose a novel capture-power-aware test compression scheme. One nonlinear code-based test compression framework: ...
In this paper, we propose a novel capture power-aware test compression scheme that is able to keep scan capture power under a safe limit with little loss in ...
In this paper a new approach that targets the reduction of both the test-data volume and the scan-power dissipation during testing of a digital system's ...
Jun 11, 2024 · Power-aware ATPG is essential for current semiconductor technologies, but it also plays a critical role in emerging technologies such as AI chips and chiplets.
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A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment · Computer Science, Engineering. 2009 Design, ...
ABSTRACT. In this paper a new approach that targets the reduction of both the test-data volume and the scan-power dissipation during testing of a digital ...
In this paper, we present a hybrid X-filling and two-stage test data compression (TS-TDC) techniques for digital VLSI circuits to reduce the test power and ...
A new low-power test compression scheme, called Dcompress, is proposed for launch-on-capture transition fault testing by using a new seed encoding scheme, ...
We present a method for test power reduction in compression-based reconfigurable scan architectures. In addition to their key objective of minimizing Test Data ...