This paper presents a new approach for designing test sequences to be generated on-chip. The proposed technique is based on machine learning, and provides a ...
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way.
On using machine learning for logic BIST | Semantic Scholar
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The main idea is that test patterns detecting random pattern resistant faults are not embedded in a pseudo-random sequence as in existing techniques, ...
On Using Machine Learning for Logic BIST ; Christophe Fagot ; Patrick Girard ; Christian Landrault.
Jan 3, 2024 · This paper describes a machine learning (ML) based approach to estimate the MBIST logic area in seconds for different configurations without synthesizing the ...
In this paper, a novel framework is presented for designing lifetime-reliable SoCs with self-adaptation capability against aging-induced degradation.
In this paper, we describe an implementing of LBIST controller for a combinational logic ripple carry adder by utilization of Xilinx ISE and ASIC flow in ...
Design of Reliable SoCs With BIST Hardware and Machine Learning. In this paper, a novel framework is presented for designing lifetime-reliable SoCs with self ...
Logic built-in self test (BIST) is increasingly being adopted to improve test quality and reduce test costs for rapidly growing designs.
Dec 11, 2021 · One study found chip area increased by 2.68% when using logic BIST, and TPs constituted 43% of this area increase [25]. It is therefore ...