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A VLSI artwork legalization technique based on a new criterion of minimum layout perturbation

Published: 01 April 1997 Publication History
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References

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Lin, S. L. and Alien J. "Minplex - A Compactor that Minimizes the Bounding Rectangle and Individual Rectangles in a Layout". IEEE/ACM Design Automation Conference 1986. pp. 123-130.
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Dong, S. K., and Pan, P. and Lo, C. Y. and Liu C. L. "Constraint Relaxation in Graph-Based Compaction". Proceedings of the 5th ACM/SIGDA Physical Design Workshop. April, 1996. pp. 256-261.
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Cited By

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  • (2018)Analog Placement Constraint Extraction and Exploration with the Application to Layout RetargetingProceedings of the 2018 International Symposium on Physical Design10.1145/3177540.3178245(98-105)Online publication date: 25-Mar-2018
  • (2017)Toward Unidirectional Routing Closure in Advanced Technology NodesIPSJ Transactions on System LSI Design Methodology10.2197/ipsjtsldm.10.210(2-12)Online publication date: 2017
  • (2015)2SAT Based Infeasibility Resolution during Design Rule Correction on Layouts with Multiple Grids2015 28th International Conference on VLSI Design10.1109/VLSID.2015.37(186-191)Online publication date: Jan-2015
  • Show More Cited By

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cover image ACM Conferences
ISPD '97: Proceedings of the 1997 international symposium on Physical design
April 1997
230 pages
ISBN:0897919270
DOI:10.1145/267665
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 01 April 1997

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ISPD97: 1997 International Symposium on Physical Design
April 14 - 16, 1997
California, Napa Valley, USA

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Overall Acceptance Rate 62 of 172 submissions, 36%

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Cited By

View all
  • (2018)Analog Placement Constraint Extraction and Exploration with the Application to Layout RetargetingProceedings of the 2018 International Symposium on Physical Design10.1145/3177540.3178245(98-105)Online publication date: 25-Mar-2018
  • (2017)Toward Unidirectional Routing Closure in Advanced Technology NodesIPSJ Transactions on System LSI Design Methodology10.2197/ipsjtsldm.10.210(2-12)Online publication date: 2017
  • (2015)2SAT Based Infeasibility Resolution during Design Rule Correction on Layouts with Multiple Grids2015 28th International Conference on VLSI Design10.1109/VLSID.2015.37(186-191)Online publication date: Jan-2015
  • (2015)Self-Aligned Double Patterning Aware Pin Access and Standard Cell Layout Co-OptimizationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.239943934:5(699-712)Online publication date: May-2015
  • (2014)Self-aligned double patterning aware pin access and standard cell layout co-optimizationProceedings of the 2014 on International symposium on physical design10.1145/2560519.2560530(101-108)Online publication date: 30-Mar-2014
  • (2014)Fixing Double Patterning violations with look-ahead2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)10.1109/ASPDAC.2014.6742881(149-154)Online publication date: Jan-2014
  • (2013)Automatic design rule correction in presence of multiple grids and track patternsProceedings of the 50th Annual Design Automation Conference10.1145/2463209.2488766(1-6)Online publication date: 29-May-2013
  • (2013)Layout Decomposition and Legalization for Double-Patterning TechnologyIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2012.223271032:2(202-215)Online publication date: 1-Feb-2013
  • (2011)A framework for double patterning-enabled designProceedings of the International Conference on Computer-Aided Design10.5555/2132325.2132329(14-20)Online publication date: 7-Nov-2011
  • (2011)Simultaneous Layout Migration and Decomposition for Double Patterning TechnologyIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2010.207999030:2(284-294)Online publication date: 1-Feb-2011
  • Show More Cited By

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