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Dynamic test signal design for analog ICs

Authors:

Giri Devarayanadurg,

Mani SomaAuthors Info & Claims

ICCAD '95: Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design

Pages 627 - 630

Published: 01 December 1995 Publication History

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Abstract

In this paper we present an approach to construct dynamic test signals for analog circuits. Using the integral measure for characterizing time-domain signals, we extend the minmax formulation of the static test problem to the dynamic case. A sub-optimal solution strategy, similar to dynamic programming methods is used to construct the test waveforms. The approach presented here may be used to construct input signals for an on-chip test scheme or for the selection of an external stimulus applied through an arbitrary waveform generator.

References

[1]

Shen-Jen Tsai, "Test Vector Generation for Linear Analog Devices", Proc. IEEE International Test Conference, pp. 592- 597, 1990.

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[2]

Naveena Nagi and J.A. Abraham, "Fault-based Automatic Test Generator for Linear Analog Circuits", Proc. oflCCAD, pp. 88-91, 1993.

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[3]

L. Milor and V. Visvanathan, "Detection of Catastrophic Faults in Analog Integrated Circuits," IEEE Trans. Computer- Aided Design, vol. CAD-8, no.2, pp. 114-130, Feb.1989.

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[4]

J.Sacks et.al, "Designs for Computer Experiments", Technometrics, Vol.31,No.1, pp.41-47, Feb. 1989.

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[5]

G.Devarayanadurg and M.Soma, "Analytical Fault Modeling and Static Test Generation for Analog Circuits",Proc. ICCAD, pp. 44-47, 1994

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G.Gielen et.al, "Fault Detection and Input Stimulus Determination for the Testing of Analog Integrated Circuits Based on Power-Supply Current Monitoring", Proc. ICCAD, pp. 495-498, 1994.

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Cited By

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Burdiek B(2001)Generation of optimum test stimuli for nonlinear analog circuits using nonlinear - programming and time-domain sensitivitiesProceedings of the conference on Design, automation and test in Europe10.5555/367072.367832(603-609)Online publication date: 13-Mar-2001
https://dl.acm.org/doi/10.5555/367072.367832
Cherubal SChatterjee A(2001)Test generation based diagnosis of device parameters for analog circuitsProceedings of the conference on Design, automation and test in Europe10.5555/367072.367831(596-602)Online publication date: 13-Mar-2001
https://dl.acm.org/doi/10.5555/367072.367831
Soma MHuynh SZhang JKim SDevarayanadurg G(2001)Hierarchical ATPG for Analog Circuits and SystemsIEEE Design & Test10.1109/54.90282418:1(72-81)Online publication date: 1-Jan-2001
https://dl.acm.org/doi/10.1109/54.902824
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Index Terms

Dynamic test signal design for analog ICs
1. Applied computing
  1. Physical sciences and engineering
2. Hardware
  1. Hardware test
  2. Robustness
    1. Hardware reliability

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Published In

ICCAD '95: Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design

December 1995

748 pages

ISBN:0818672137

Chairman:
Richard Rudell
Synopsys, Inc., Mountain View, CA

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IEEE Computer Society

United States

Publication History

Published: 01 December 1995

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ICCAD '95

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SIGDA
IEEE-CS

ICCAD '95: International Conference on Computer Aided Design

November 5 - 9, 1995

California, San Jose, USA

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Overall Acceptance Rate 457 of 1,762 submissions, 26%

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Cited By

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Burdiek B(2001)Generation of optimum test stimuli for nonlinear analog circuits using nonlinear - programming and time-domain sensitivitiesProceedings of the conference on Design, automation and test in Europe10.5555/367072.367832(603-609)Online publication date: 13-Mar-2001
https://dl.acm.org/doi/10.5555/367072.367832
Cherubal SChatterjee A(2001)Test generation based diagnosis of device parameters for analog circuitsProceedings of the conference on Design, automation and test in Europe10.5555/367072.367831(596-602)Online publication date: 13-Mar-2001
https://dl.acm.org/doi/10.5555/367072.367831
Soma MHuynh SZhang JKim SDevarayanadurg G(2001)Hierarchical ATPG for Analog Circuits and SystemsIEEE Design & Test10.1109/54.90282418:1(72-81)Online publication date: 1-Jan-2001
https://dl.acm.org/doi/10.1109/54.902824
Chakrabarti SChatterjee ASentovich E(2000)Partial simulation-driven ATPG for detection and diagnosis of faults in analog circuitsProceedings of the 2000 IEEE/ACM international conference on Computer-aided design10.5555/602902.603027(562-568)Online publication date: 5-Nov-2000
https://dl.acm.org/doi/10.5555/602902.603027
Variyam PChatterjee A(2000)Digital-Compatible BIST for Analog Circuits Using Transient Response SamplingIEEE Design & Test10.1109/54.86790117:3(106-115)Online publication date: 1-Jul-2000
https://dl.acm.org/doi/10.1109/54.867901
Variyam PHou JChatterjee A(1999)Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical SimulationProceedings of the 1999 17TH IEEE VLSI Test Symposium10.5555/832299.836523Online publication date: 26-Apr-1999
https://dl.acm.org/doi/10.5555/832299.836523
Gomes AChatterjee AWhite JSentovich E(1999)Robust optimization based backtrace method for analog circuitsProceedings of the 1999 IEEE/ACM international conference on Computer-aided design10.5555/339492.340031(304-308)Online publication date: 7-Nov-1999
https://dl.acm.org/doi/10.5555/339492.340031
Gomes AChatterjee A(1999)Minimal length diagnostic tests for analog circuits using test historyProceedings of the conference on Design, automation and test in Europe10.1145/307418.307488(41-es)Online publication date: 1-Jan-1999
https://dl.acm.org/doi/10.1145/307418.307488
Ramadoss RBushnell M(1999)Test Generation for Mixed-Signal Devices Using Signal Flow GraphsJournal of Electronic Testing: Theory and Applications10.1023/A:100834981790314:3(189-205)Online publication date: 1-Jun-1999
https://dl.acm.org/doi/10.1023/A%3A1008349817903
Huynh SKim SSoma MZhang JYasuura H(1998)Testability analysis and multi-frequency ATPG for analog circuits and systemsProceedings of the 1998 IEEE/ACM international conference on Computer-aided design10.1145/288548.289057(376-383)Online publication date: 1-Nov-1998
https://dl.acm.org/doi/10.1145/288548.289057
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