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An empirical study on the usage of testability information to fault localization in software

Published: 21 March 2011 Publication History

Abstract

When failures occur during software testing, automated software fault localization helps to diagnose their root causes and identify the defective statements of a program to support debugging. Diagnosis is carried out by selecting test cases in such way that their pass or fail information will narrow down the set of fault candidates, and, eventually, pinpoint the root cause. An essential in gredient of effective and efficient fault localization is knowledge about the false negative rate of tests, which is related to the rate at which defective statements of a program will exhibit failures. In current fault localization processes, false negative rates are either ignored completely, or merely estimated a posteriori as part of the diagnosis. In this paper, we study the reduction in diagnosis effort when false negative rates are known a priori. We deduce this information from testability, following the propagation-infection-execution (PIE) approach. Experiments with real programs suggest significant improvement in the diagnosis process, both in the single and the multiple-fault cases. When compared to the next-best technique, PIE-based false negative rate information yields a fault localization effort reduction of up to 80% for systems with only one fault, and up to 60% for systems with multiple faults.

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cover image ACM Conferences
SAC '11: Proceedings of the 2011 ACM Symposium on Applied Computing
March 2011
1868 pages
ISBN:9781450301138
DOI:10.1145/1982185
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 21 March 2011

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SAC'11
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SAC'11: The 2011 ACM Symposium on Applied Computing
March 21 - 24, 2011
TaiChung, Taiwan

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Overall Acceptance Rate 1,650 of 6,669 submissions, 25%

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  • (2016)A Survey on Software Fault LocalizationIEEE Transactions on Software Engineering10.1109/TSE.2016.252136842:8(707-740)Online publication date: 1-Aug-2016
  • (2014)Automatic systems diagnosis without behavioral models2014 IEEE Aerospace Conference10.1109/AERO.2014.6836252(1-8)Online publication date: Mar-2014
  • (2011)Probabilistic Error Propagation Modeling in Logic CircuitsProceedings of the 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops10.1109/ICSTW.2011.40(617-623)Online publication date: 21-Mar-2011
  • (2011)Prioritizing tests for fault localization through ambiguity group reductionProceedings of the 26th IEEE/ACM International Conference on Automated Software Engineering10.1109/ASE.2011.6100153(83-92)Online publication date: 6-Nov-2011

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