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Power supply noise analysis methodology for deep-submicron VLSI chip design

Published: 13 June 1997 Publication History

Abstract

This paper describes a new design methodology to analyzethe on-chip power supply noise for high-performance microprocessors.Based on an integrated package-level andchip-level power bus model, and a simulated switching circuitmodel for each functional block, this methodology offersthe most complete and accurate analysis of Vdd distributionfor the entire chip. The analysis results not only providedesigners with the inductive ΔI noise and the resistive IRdrop data at the same time, but also allow designers to easilyidentify the hot spots on the chip and ΔV across the chip.Global and local optimization such as buffer sizing, powerbus sizing, and on-chip decoupling capacitor placement canthen be conducted to maximize the circuit performance andminimize the noise.

References

[1]
H. Bakoglu, Circuits, Interconnections, and Packaging for VLSI. Addison-Wesley, 1990.
[2]
W. Bowhill et al., "A 300 MHz 64b quad-issue CMOS RISC microprocessor," in Proc. International Solid-State Circuits Conference, pp. 182-183, February 1995.
[3]
L. Miller, "Controlled collapse reflow chip joining," IBM Journal of Research and Development, vol. 13, no. 3, pp. 239-250, 1969.
[4]
B. Rubin, "An electromagnetic approach for modeling high-performance computer packages," IBM Journal of Research and Development, vol. 34, pp. 585-600, July 1990.
[5]
B. Davari et al., "A high performance 0.25urn CMOS technology," in Proc. International Electron Devices Meeting, pp. 56-59, December 1988.
[6]
D. Dobberpuhl et al., "A 200-MHz 64-bit dual-issue CMOS microprocessor," IEEE Journal of Solid-State Circuits, pp. 1555-1567, November 1992.
[7]
J. Seliskar et al., "Voltage limitation of 0.5urn CMOS on thin SOI," in Proc. International Symposium on Siliconon-Insulator Technology and Devices, pp. 118-119, May 1992.
[8]
A. Acovic et al., "Hot carrier reliability of fully depleted accumulation mode SOI MOSFETs," in Proc. IEEE International SO1 Conference, pp. 134-135, October 1992.
[9]
F. Assaderaghi et al., "A dynamic threshold voltage MOSFET (DTMOS) for ultra-low voltage operation," in Proc. International Electron Devices Meeting, pp. 809- 812, December 1994.

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  • (2024)A Survey and Recent Advances: Machine Intelligence in Electronic TestingJournal of Electronic Testing10.1007/s10836-024-06117-740:2(139-158)Online publication date: 15-Apr-2024
  • (2022)A Radial Basis Function Network-Based Surrogate-Assisted Swarm Intelligence Approach for Fast Optimization of Power Delivery NetworksIEEE Transactions on Signal and Power Integrity10.1109/TSIPI.2022.32171091(140-149)Online publication date: 2022
  • (2022)Clock-Gated Variable Frequency Signaling to Alleviate Power Supply Noise in a Packaged ICIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2021.309943841:6(1704-1715)Online publication date: Jun-2022
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cover image ACM Conferences
DAC '97: Proceedings of the 34th annual Design Automation Conference
June 1997
788 pages
ISBN:0897919203
DOI:10.1145/266021
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Publication History

Published: 13 June 1997

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DAC97: The 34th Design Automation Conference
June 9 - 13, 1997
California, Anaheim, USA

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DAC '97 Paper Acceptance Rate 139 of 400 submissions, 35%;
Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

View all
  • (2024)A Survey and Recent Advances: Machine Intelligence in Electronic TestingJournal of Electronic Testing10.1007/s10836-024-06117-740:2(139-158)Online publication date: 15-Apr-2024
  • (2022)A Radial Basis Function Network-Based Surrogate-Assisted Swarm Intelligence Approach for Fast Optimization of Power Delivery NetworksIEEE Transactions on Signal and Power Integrity10.1109/TSIPI.2022.32171091(140-149)Online publication date: 2022
  • (2022)Clock-Gated Variable Frequency Signaling to Alleviate Power Supply Noise in a Packaged ICIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2021.309943841:6(1704-1715)Online publication date: Jun-2022
  • (2020)Fast IR drop estimation with machine learningProceedings of the 39th International Conference on Computer-Aided Design10.1145/3400302.3415763(1-8)Online publication date: 2-Nov-2020
  • (2018)Investigation of the Power Grid Accuracy by CMOS Transistor Network using Matlab/ SimulinkTikrit Journal of Engineering Sciences10.25130/tjes.25.3.0425:3(19-23)Online publication date: 1-Sep-2018
  • (2018)A Quick Assessment of Nonlinearity in Power Delivery Networks2018 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS)10.1109/EDAPS.2018.8680881(1-3)Online publication date: Dec-2018
  • (2018)Power Supply Noise Aware Task Scheduling on Homogeneous 3D MPSoCs Considering the Thermal ConstraintJournal of Computer Science and Technology10.1007/s11390-018-1868-633:5(966-983)Online publication date: 12-Sep-2018
  • (2017)PSN‐aware circuit test timing prediction using machine learningIET Computers & Digital Techniques10.1049/iet-cdt.2016.003211:2(60-67)Online publication date: 25-Jan-2017
  • (2014)Globally Constrained Locally Optimized 3-D Power Delivery NetworksIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2013.228380022:10(2131-2144)Online publication date: Oct-2014
  • (2013)Design of Effective Supply Voltage Monitor for Measuring Power Rails of Integrated CircuitsIEICE Transactions on Electronics10.1587/transele.E96.C.538E96.C:4(538-545)Online publication date: 2013
  • Show More Cited By

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