Abstract
In this work experimental results on a built-in current sensor for dynamic current testing, i(t), based on integration concepts are presented. The experimental validation proposed in this work is done through a VLSI CMOS circuit implemented in a 0.7 μm technology. Different experiences have been developed analyzing the detectability of several kind of defects through this technique. The encouraging results obtained present this technique as an attractive complement to boolean and I testing.
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Picos, R., Roca, M., Isern, E. et al. Experimental Results on BIC Sensors for Transient Current Testing. Journal of Electronic Testing 16, 235–241 (2000). https://doi.org/10.1023/A:1008339315137
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DOI: https://doi.org/10.1023/A:1008339315137