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Empirical analysis of network measures for predicting high severity software faults

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Abstract

Network measures are useful for predicting fault-prone modules. However, existing work has not distinguished faults according to their severity. In practice, high severity faults cause serious problems and require further attention. In this study, we explored the utility of network measures in high severity faultproneness prediction. We constructed software source code networks for four open-source projects by extracting the dependencies between modules. We then used univariate logistic regression to investigate the associations between each network measure and fault-proneness at a high severity level. We built multivariate prediction models to examine their explanatory ability for fault-proneness, as well as evaluated their predictive effectiveness compared to code metrics under forward-release and cross-project predictions. The results revealed the following: (1) most network measures are significantly related to high severity fault-proneness; (2) network measures generally have comparable explanatory abilities and predictive powers to those of code metrics; and (3) network measures are very unstable for cross-project predictions. These results indicate that network measures are of practical value in high severity fault-proneness prediction.

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References

  1. Zhou Y, Leung H. Empirical analysis of object-oriented design metrics for predicting high and low severity faults. IEEE Trans Softw Eng, 2006, 32: 771–789

    Article  Google Scholar 

  2. Chhillar R S, Nisha. Empirical analysis of object-oriented design metrics for predicting high, medium and low severity faults using mallows Cp. ACM SIGSOFT Softw Eng Notes, 2011, 36: 1–9

    Article  Google Scholar 

  3. Basili V R, Briand L C, Melo W L. A validation of object-oriented design metrics as quality indicators. IEEE Trans Softw Eng, 1996, 22: 751–761

    Article  Google Scholar 

  4. Subramanyam R, Krishnan M S. Empirical analysis of ck metrics for object-oriented design complexity: implications for software defects. IEEE Trans Softw Eng, 2003, 29: 297–310

    Article  Google Scholar 

  5. Nagappan N, Ball T, Zeller A. Mining metrics to predict component failures. In: Proceedings of the 28th International Conference on Software Engineering. New York: ACM, 2006. 452–461

    Google Scholar 

  6. Zhang H Y. An investigation of the relationships between lines of code and defects. In: Proceedings of 2009 IEEE International Conference on Software Maintenance. Piscataway: IEEE, 2009. 274–283

    Chapter  Google Scholar 

  7. Nagappan N, Ball T. Use of relative code churn measures to predict system defect density. In: Proceedings of the 27th International Conference on Software Engineering. Piscataway: IEEE, 2005. 284–292

    Google Scholar 

  8. Moser R, Pedrycz W, Succi G. A comparative analysis of the efficiency of change metrics and static code attributes for defect prediction. In: Proceedings of the 30th International Conference on Software Engineering. Piscataway: IEEE, 2008. 181–190

    Google Scholar 

  9. Hassan A E. Predicting faults using the complexity of code changes. In: Proceedings of the 31st International Conference on Software Engineering. Piscataway: IEEE, 2009. 78–88

    Google Scholar 

  10. Hassan A E, Holt R C. The top ten list: dynamic fault prediction. In: Proceedings of the 21st IEEE International Conference on Software Maintenance. Piscataway: IEEE, 2005. 263–272

    Chapter  Google Scholar 

  11. Ostrand T J, Weyuker E J, Bell R M. Predicting the location and number of faults in large software systems. IEEE Trans Softw Eng, 2005, 31: 340–355

    Article  Google Scholar 

  12. Zhang W Q, Nie L M, Jiang H, et al. Developer social networks in software engineering: construction, analysis, and applications. Sci China Inf Sci, 2014, 57: 121101

    Google Scholar 

  13. Zimmermann T, Nagappan N. Predicting defects with program dependencies. In: Proceedings of the 3rd International Symposium on Empirical Software Engineering and Measurement. Piscataway: IEEE, 2009: 435–438

    Google Scholar 

  14. Zimmermann T, Nagappan N. Predicting defects using network analysis on dependency graphs. In: Proceedings of the 30th International Conference on Software Engineering. New York: ACM, 2008. 531–540

    Google Scholar 

  15. Taba S E S, Khomh F, Zou Y, et al. Predicting bugs using antipatterns. In: Proceedings of the 29th IEEE International Conference on Software Maintenance. Piscataway: IEEE, 2013. 270–279

    Google Scholar 

  16. Tosun A, Turhan B, Bener A. Validation of network measures as indicators of defective modules in software systems. In: Proceedings of the 5th International Conference on Predictor Models in Software Engineering. New York: ACM, 2009. 1–5

    Google Scholar 

  17. Premraj R, Herzig K. Network versus code metrics to predict defects: a replication study. In: Proceedings of the 5th International Symposium on Empirical Software Engineering and Measurement. Piscataway: IEEE, 2011. 215–224

    Google Scholar 

  18. Nguyen T H D, Adams B, Hassan A E. Studying the impact of dependency network measures on software quality. In: Proceedings of the 2010 IEEE International Conference on Software Maintenance. Piscataway: IEEE, 2010. 1–10

    Google Scholar 

  19. Ma Y, He K, Li B, et al. How multiple-dependency structure of classes affects their functions a statistical perspective. In: Proceedings of the 2nd International Conference on Software Technology and Engineering. Piscataway: IEEE, 2010, v2: 60–66

    Google Scholar 

  20. Basili V R, Shull F, Lanubile F. Building knowledge through families of experiments. IEEE Trans Softw Eng, 1999, 25: 456–473

    Article  Google Scholar 

  21. Halstead M H. Elements of Software Science. New York: Elsevier, 1977. 50–70

    MATH  Google Scholar 

  22. Chidamber S R, Kemerer C F. A metrics suite for object oriented design. IEEE Trans Softw Eng, 1994, 20: 476–493

    Article  Google Scholar 

  23. Hosmer Jr D W, Lemeshow S. Applied Logistic Regression. New Jersey: John Wiley & Sons, 2004. 153–223

    Google Scholar 

  24. Belsley D A, Kuh E, Welsch R E. Regression Diagnostics: Identifying Influential Data and Sources of Collinearity. New Jersey: John Wiley & Sons, 2005. 6–38

    Book  MATH  Google Scholar 

  25. Harrell F E. Regression Modeling Strategies: With Applications to Linear Models, Logistic Regression, and Survival Analysis. New York: Springer, 2001. 215–268

    MATH  Google Scholar 

  26. Kutner M H, Nachtsheim C, Neter J. Applied Linear Regression Models. 4th ed. Chicago: Irwin, 2004. 20–70

    Google Scholar 

  27. Maddala G S. Limited-Dependent and Qualitative Variables in Econometrics. New York: Cambridge University Press, 1983. 100–124

    Book  MATH  Google Scholar 

  28. Nagelkerke N J D. A note on a general definition of the coefficient of determination. Biometrika, 1991, 78: 691–692

    Article  MathSciNet  MATH  Google Scholar 

  29. Benjamini Y, Hochberg Y. Controlling the false discovery rate: a practical and powerful approach to multiple testing. J Royal Stat Soc Ser B (Methodological), 1995, 57: 289–300

    MathSciNet  MATH  Google Scholar 

  30. Freeman E A, Moisen G G. A comparison of the performance of threshold criteria for binary classification in terms of predicted prevalence and kappa. Ecol Model, 2008, 217: 48–58

    Article  Google Scholar 

  31. He Z, Shu F, Yang Y, et al. An investigation on the feasibility of cross-project defect prediction. Autom Softw Eng, 2012, 19: 167–199

    Article  Google Scholar 

  32. Chang R H, Mu X D, Zhang L. Software defect prediction using non-negative matrix factorization. J Softw, 2011, 6: 2114–2120

    Google Scholar 

  33. Yin R K. Case Study Research: Design and Methods. 3rd ed. New York: SAGE Publications, 2002. 120–180

    Google Scholar 

  34. Kim S, Zhang H, Wu R, et al. Dealing with noise in defect prediction. In: Proceedings of the 33rd International Conference on Software Engineering. Piscataway: IEEE, 2011. 481–490

    Google Scholar 

  35. Zhou Y, Xu B, Leung H. On the ability of complexity metrics to predict fault-prone classes in object-oriented systems. J Syst Softw, 2010, 83: 660–674

    Article  Google Scholar 

  36. Zhou Y, Leung H, Xu B. Examining the potentially confounding effect of class size on the associations between object-oriented Metrics and change-proneness. IEEE Trans Softw Eng, 2009, 35: 607–623

    Article  Google Scholar 

  37. Pan K, Kim S, Whitehead E J. Bug classification using program slicing metrics. In: Proceedings of the 6th International Working Conference on Source Code Analysis and Manipulation, Philadelphia, 2006. 31–42

    Google Scholar 

  38. Koru A G, Tian J. Comparing high-change modules and modules with the highest measurement values in two large-scale open-source products. IEEE Trans Softw Eng, 2005, 31: 625–642

    Article  Google Scholar 

  39. Menzies T, Greenwald J, Frank A. Data mining static code attributes to learn defect predictors. IEEE Trans Softw Eng, 2007, 33: 2–13

    Article  Google Scholar 

  40. Singh Y, Kaur A, Malhotra R. Empirical validation of object-oriented metrics for predicting fault proneness models. Softw Qual J, 2010, 18: 3–35

    Article  Google Scholar 

  41. Shatnawi R, Li W. The effectiveness of software metrics in identifying fault-prone classes in post-release software evolution process. J Syst Softw, 2008, 81: 1868–1882

    Article  Google Scholar 

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Authors and Affiliations

  1. State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing, 210023, China

    Lin Chen, Wanwangying Ma, Yuming Zhou, Lei Xu, Zhifei Chen & Baowen Xu

  2. School of Computer Science and Technology, Nanjing University of Posts and Telecommunications, Nanjing, 210023, China

    Ziyuan Wang

Authors
  1. Lin Chen
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  2. Wanwangying Ma
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  3. Yuming Zhou
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  4. Lei Xu
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  5. Ziyuan Wang
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  6. Zhifei Chen
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  7. Baowen Xu
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Correspondence to Baowen Xu.

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Chen, L., Ma, W., Zhou, Y. et al. Empirical analysis of network measures for predicting high severity software faults. Sci. China Inf. Sci. 59, 122901 (2016). https://doi.org/10.1007/s11432-015-5426-3

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  • DOI: https://doi.org/10.1007/s11432-015-5426-3

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