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Error analysis based on error transfer theory and compensation strategy for LED chip visual localization systems

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Abstract

In the manufacturing process of LED chips, the accuracy of the LED chip visual localization system affects the quality of LED chip production directly. There are many errors that have impacts on positioning system accuracy. Therefore, the identification and compensation of the critical errors is key to efficiently improving the precision of the system. Based on this fact, an error analysis method and an error compensation strategy are proposed in this paper. The first step was to measure the relevant error sources that may affect the localization system. Then error model of localization system was established, and the validity of this error model was verified by comparing simulated and actual positioning results. In addition, the impact factors of each error source on localization system accuracy were obtained using the error transfer theory. According to the error analysis results, an efficient error compensation strategy was proposed, which could compensate the errors in order of impact factors, and judge whether the error compensation method is optimal. Finally, the experimental results proved that the proposed error analysis method was valid and the error compensation strategy could efficiently enhance the positioning accuracy to meet the industrial application requirements.

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References

  • Abderrazak, E. O., Michel, G., & Abdellah, B. (2000). Accuracy enhancement of multi-axis CNC machines through on-line neurocompensation. Journal of Intelligent Manufacturing, 11(6), 535–545.

    Article  Google Scholar 

  • Avargel, Y., & Cohen, I. (2010). Undermodeling-error quantification for quadratically nonlinear system identification in the short-time fourier transform domain. IEEE Transactions on Signal Processing, 58(12), 6052–6065.

    Article  Google Scholar 

  • Gong, S. H., Lu, H. Q., Zeng, Z., Wang, Z. Y., & Li, D. L. (2019). Vibration suppression of rotating arm in LED chip sorter using feedforward-feedback control with an optimal curve. Precision Engineering, 56, 513–523.

    Article  Google Scholar 

  • Hsu, C. C., & Chen, M. S. (2016). Intelligent maintenance prediction system for LED wafer testing machine. Journal of Intelligent Manufacturing, 27(2), 335–342.

    Article  Google Scholar 

  • Hung, T. C., & Ding, C. H. (2011). Small-wavelength form error compensation during hydrodynamic polishing. International Journal of Machine Tools and Manufacture, 51(12), 880–888.

    Article  Google Scholar 

  • Kuo, C. F. J., Hsu, C. T. M., Liu, Z. X., & Wu, H. C. (2014). Automatic inspection system of LED chip using two-stages back-propagation neural network. Journal of Intelligent Manufacturing, 25(6), 1235–1243.

    Article  Google Scholar 

  • Kuo, C. F. J., Tsai, C. H., Wang, W. R., & Wu, H. C. (2016). Automatic marking point positioning of printed circuit boards based on template matching technique. Journal of Intelligent Manufacturing, 30(2), 671–685.

    Article  Google Scholar 

  • Kuo, C. F. J., Tung, C. P., & Weng, W. H. (2019). Applying the support vector machine with optimal parameter design into an automatic inspection system for classifying micro-defects on surfaces of light-emitting diode chips. Journal of Intelligent Manufacturing, 30(2), 727–741.

    Article  Google Scholar 

  • Li, W., Li, Z. P., Ren, Y. H., & Huang, X. M. (2018). Error analysis of high-speed precision micro-spindle equipped with micro-tool in mechanical micro-grinding. International Journal of Advanced Manufacturing Technology, 97(1–4), 599–609.

    Article  Google Scholar 

  • Lin, H., Li, B., Wang, X., Shu, Y., & Niu, S. (2019). Automated defect inspection of LED chip using deep convolutional neural network. Journal of Intelligent Manufacturing, 30, 2525–2534.

    Article  Google Scholar 

  • Mehrabi, M. G., Neal, G. O., Min, B. K., Pasek, Z., Koren, Y., & Szuba, P. (2002). Improving machining accuracy in precision line boring. Journal of Intelligent Manufacturing, 13(5), 379–389.

    Article  Google Scholar 

  • Mok, H. S., Kim, S. H., & Cho, Y. H. (2007). Reduction of PMSM torque ripple caused by resolver position error. Electronics Letters, 43(11), 646–647.

    Article  Google Scholar 

  • Wang, Z., Gong, S., Li, D., & Lu, H. (2017). Error analysis and improved calibration algorithm for LED chip localization system based on visual feedback. International Journal of Advanced Manufacturing Technology, 92(9–12), 1–10.

    Google Scholar 

  • Wang, Z. Y., Gong, S. H., Li, D. L., Zhou, D. Y., & Lu, H. Q. (2019). LED chip accurate positioning control based on visual servo using dual rate adaptive fading Kalman filter. ISA Transactions, 87, 163–173.

    Article  Google Scholar 

  • Wang, S. H., Zheng, J., Hu, H. M., & Li, B. (2013). Naturalness preserved enhancement algorithm for non-uniform illumination images. IEEE Transactions on Image Processing, 22(9), 3538–3548.

    Article  Google Scholar 

  • Xiao, N. F., & Nahavandi, S. (2004). Visual feedback control of a robot in an unknown environment (learning control using neural networks). International Journal of Advanced Manufacturing Technology, 24(7–8), 509–516.

    Google Scholar 

  • Yuan, J., Fung, S. W., Chan, K. Y., & Xu, R. Y. (2012). An interpolation-based calibration architecture for pipeline ADC with nonlinear error. IEEE Transactions on Instrumentation and Measurement, 61(1), 17–25.

    Article  Google Scholar 

  • Zhang, Z. Y. (2000). A flexible new technique for camera calibration. IEEE Transactions on Pattern Analysis and Machine Intelligence, 22(11), 1330–1334.

    Article  Google Scholar 

  • Zhang, B. Y., Yang, H., & Yin, Z. P. (2015). A region-based normalized cross correlation algorithm for the vision-based positioning of elongated IC chips. IEEE Transactions on Semiconductor Manufacturing, 28(3), 345–352.

    Article  Google Scholar 

  • Zhang, Y. R., Zhu, J., Tanaka, T., & Saito, Y. (2012). Measurement of movement error and its compensation for 6-DOF parallel mechanism worktable. Key Engineering Materials, 523–524, 463–468.

    Article  Google Scholar 

  • Zhong, F. Q., He, S. P., & Li, B. (2015). Blob analyzation-based template matching algorithm for LED chip localization. International Journal of Advanced Manufacturing Technology, 93(1–4), 55–63.

    Google Scholar 

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Acknowledgments

This research is supported in part by the National Key Research and Development Program of China (No. 2016YFC0105306).

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Correspondence to Shihua Gong.

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Zhou, D., Gong, S., Wang, Z. et al. Error analysis based on error transfer theory and compensation strategy for LED chip visual localization systems. J Intell Manuf 32, 1345–1359 (2021). https://doi.org/10.1007/s10845-020-01615-9

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  • DOI: https://doi.org/10.1007/s10845-020-01615-9

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