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Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors

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Abstract

Testing the RF functions of systems-on-chip incurs a very high cost. Built-in test is a promising alternative to facilitate testing and reduce cost. However, designing built-in test circuits that tap into the sensitive RF signal paths, in order to extract useful information for the purpose of testing, often finds the designers reluctant since it results in some performance degradation that needs to be accounted for during the design. In this paper, we study a transparent built-in test approach based on non-intrusive sensors that are not electrically connected to the RF circuit under test. The non-intrusive sensors simply monitor process variations and by virtue of this they are capable of tracking variations in the performances of the RF circuit as well. The alternate test paradigm is employed to map the outputs of the sensors to the performances, in order to replace the standard tests for measuring the performances directly. We discuss in this paper the principle of operation of these sensors and we demonstrate the non-intrusive test approach on a 65nm RF low noise amplifier.

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Notes

  1. 1 We stick to the term “measurements” in this Section so as to keep consistency with the rest of the paper, however, the reader should be aware that this term is used abusively in this Section since the experiment is based exclusively on simulations.

References

  1. Abdallah L, Stratigopoulos H-G, Mir S, Kelma C (2011) RF front-end test using built-in sensors. IEEE Des Test Comput 28(6):76–84

    Article  Google Scholar 

  2. Abdallah L, Stratigopoulos H-G, Mir S, Kelma C (2012) Experiences with non-intrusive sensors for RF built-in test.. In: Proceedings of IEEE international test conference, Anaheim, CA, USA. Paper 17.1.

  3. Abdallah L, Stratigopoulos H-G, Mir S, Altet J (2013) Defect-oriented non-intrusive RF test using on-chip temperature sensors. In: Proceedings of IEEE VLSI test symposium, Berkeley, CA, USA

  4. Acar E, Ozev S (2008) Defect-oriented testing of RF circuits. IEEE Trans Comput Aided Des Integr Circ Syst 27(5):920–931

    Article  Google Scholar 

  5. Andraud M, Stratigopoulos H-G, Simeu E (2014) One-shot calibration of RF circuits based on non-intrusive sensors.. In: Proceedings of design automation conference, San Francisco, CA, USA

  6. Barragan MJ, Fiorelli R, Léger G, Rueda A, Huertas JL (2011) Alternate test of LNAs through ensemble learning of on-chip digital envelope signals. J Electron Test Theory Appl 27(3):277–288

    Article  Google Scholar 

  7. Bhattacharya S, Chatterjee A (2006) A DFT approach for testing embedded systems using DC sensors. IEEE Design & Test of Computers 23(6):464–475

    Article  Google Scholar 

  8. Bhushan M, Gattiker A, Ketchen MB, Das KK (2006) Ring oscillators for CMOS process tuning and variability control. IEEE Trans Semicond Manuf 19(1):10–18

    Article  Google Scholar 

  9. Bishop CM (1995) Neural networks for pattern recognition. Oxford University Press

  10. Brown D, Ferrario J, Wolf R, Li J, Bhagat J, Slamani M (2007) RF testing on a mixed signal tester. J Electron Test Theory Appl 23(1):85–94

    Article  Google Scholar 

  11. Cimino M, Lapuyade H, Deval Y, Taris T, Bégueret J-B (2008) Design of a 0.9V 2.45 GHz self-testable and reliability-enhanced CMOS LNA. IEEE J Solid-State Circ 43(5):1187–1194

    Article  Google Scholar 

  12. Dabrowski JJ, Ramzan RM (2010) Built-in loopback test for IC RF transceivers. IEEE Trans Very Large Scale Integration (VLSI) Syst 18(6):933–946

    Article  Google Scholar 

  13. Ellouz S, Gamand P, Kelma C, Vandewiele B, Allard B (2006) Combining internal probing with artficial neural networks for optimal RFIC testing.. In: Proceedings of IEEE international test conference, Santa Clara, CA, USA, pp 4.3.1–4.3.9

  14. Ferrario J, Wolf R, Moss S, Slamani M (2003) A low-cost test solution for wireless phone RFICs. IEEE Commun Mag 41(9):82–88

    Article  Google Scholar 

  15. Gopalan A, Margala M, Mukund PR (2005) A current based self-test methodology for RF front-end circuits. Microelectron J 36(12):1091–1102

    Article  Google Scholar 

  16. Halder A, Chatterjee A (2005) Low-cost alternate EVM test for wireless receiver systems.. In: Proceedings of IEEE VLSI test symposium, Palm Springs, CA, USA, pp 255–260

  17. Hastie T, Tibshirani R, Friedman J (2001) The elements of statistical learning: data mining, inference, and prediction. Springer

  18. Huang Y-C, Hsieh H-H, Lu L-H (2008) A built-in self-test technique for RF low-noise amplifiers. IEEE Trans Microw Theory Tech 56(2):1035–1042

    Article  Google Scholar 

  19. Jarwala M, Duy L, Heutmaker MS (1995) End-to-end test strategy for wireless systems.. In: Proceedings of IEEE international test conference, Washington, DC, USA, pp 940–946

  20. Liaperdos J, Stratigopoulos H-G, Abdallah L, Tsiatouhas Y, Arapoyanni A, Li X (2015) Fast deployment of alternate analog test using bayesian model fusion.. In: Proceedings of design, automation and test in Europe conference, Grenoble, France

  21. Méndez-Rivera MG, Valdes-Garcia A, Silva-Martinez J, Sánchez-Sinencio E (2005) An on-chip spectrum analyzer for analog built-in testing. J Electron Test Theory Appl 21(3):205–219

    Article  Google Scholar 

  22. Nassery A, Ozev S, Verhelst M, Slamani M (2011) Extraction of EVM from transmitter system parameters.. In: Proceedings of IEEE European test symposium, Trondheim, Norway, pp 75–80

  23. Pang L-T, Nikolic B (2009) Measurements and analysis of process variability in 90 nm CMOS. IEEE J Solid-State Circ 44(5):1655–1663

    Article  Google Scholar 

  24. Serhan A, Abdallah L, Stratigopoulos H-G, Mir S (2014) Low-cost EVM built-in test of RF transceivers.. In: Proceedings of IEEE international design & test symposium, Algiers, Algeria, pp 51–54

  25. Stratigopoulos H-G, Mir S (2012) Adaptive alternate analog test. IEEE Des Test Comput 29(4):71–79

    Article  Google Scholar 

  26. Stratigopoulos H-G, Sunter S (2014) Efficient Monte Carlo-based analog parametric fault modelling.. In: Proceedings of IEEE VLSI test symposium, Napa, CA, USA

  27. Tsividis Y (2002) Mixed analog-digital vlsi devices and technology. World Scientific

  28. Valdes-Garcia A, Silva-Martinez J, Sanchez-Sinencio E (2006) On-chip testing techniques for RF wireless transceivers. IEEE Des Test Comput 23(4):268–277

    Article  Google Scholar 

  29. Valdes-Garcia A, Venkatasubramanian R, Silva-Martinez J, Sanchez-Sinencio E (2008) A broadband CMOS amplitude detector for on-chip RF measurements. IEEE Trans Instrum Meas 57(7):1470–1477

    Article  Google Scholar 

  30. Voorakaranam R, Cherubal S, Chatterjee A (2002) A signature test framework for rapid production testing of RF circuits.. In: Proceedings design, automation and test in Europe conference, Paris, France, pp 186–191

  31. Yoon J-S, Eisenstadt WR (2005) Embedded loopback test for RF ICs. IEEE Trans Instrum Meas 54 (5):1715–1720

    Article  Google Scholar 

  32. Zhang C, Gharpurey R, Abraham JA (2012) Built-in self test of RF subsystems with integrated sensors. J Electron Test Theory Appl 28(5):557–569

    Article  Google Scholar 

  33. Zjajo A, Barragan Asian M, Pyneda de Gyvez J (2007) BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits.. In: Proceedings of design, automation & test in Europe conference, Nice, France, pp 1301–1306

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Acknowledgments

This research has been carried out in the framework of the projects ENIAC ELESIS and ANR SACSO.

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Authors and Affiliations

  1. Université Grenoble Alpes, TIMA, 38000, Grenoble, France

    Athanasios Dimakos & Salvador Mir

  2. CNRS, TIMA, 38000, Grenoble, France

    Athanasios Dimakos & Salvador Mir

  3. CEA-LETI, MINATEC Campus, 17 Rue des Martyrs, 38054, Grenoble, France

    Alexandre Siligaris & Emeric De Foucauld

  4. Sorbonne Universités, UPMC University Paris 06, CNRS, LIP6, 4 place Jussieu, 75005, Paris, France

    Haralampos-G. Stratigopoulos

Authors
  1. Athanasios Dimakos
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  2. Haralampos-G. Stratigopoulos
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  3. Alexandre Siligaris
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  4. Salvador Mir
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  5. Emeric De Foucauld
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Corresponding author

Correspondence to Haralampos-G. Stratigopoulos.

Additional information

Responsible Editor: T. Xia

A preliminary version of this work appears in: A. Dimakos et al., “Non-Intrusive Built-In Test for 65nm RF LNA”, 19th IEEE International Mixed-Signal, Sensors, and Systems Test Workshop, 2014.

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Dimakos, A., Stratigopoulos, HG., Siligaris, A. et al. Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors. J Electron Test 31, 381–394 (2015). https://doi.org/10.1007/s10836-015-5534-4

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  • DOI: https://doi.org/10.1007/s10836-015-5534-4

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