Nothing Special   »   [go: up one dir, main page]

Skip to main content
Log in

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser

  • Published:
Journal of Electronic Testing Aims and scope Submit manuscript

Abstract

This paper discusses multiple methods of Single-Event Transient (SET) measurements on a commercial DC/DC Pulse Width Modulator (PWM). Heavy ion, proton, and pulsed laser are used in the experiments. The correlations between the heavy ion, pulsed laser and proton data are analyzed and presented. A proton cross-section model is used to derive proton cross-section from heavy ion test data. The calculated result is close to the real proton data, which means the heavy ion and proton data fit well. The relationship between pulsed laser and proton are also analyzed through heavy as a medium.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Subscribe and save

Springer+ Basic
$34.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6

Similar content being viewed by others

References

  1. Akkerman A, Barak J, Lifshitz Y (2002) Nuclear models for proton induced upsets: a critical comparison. IEEE Trans Nucl Sci 49(3):1539–1546

    Article  Google Scholar 

  2. Barak J (2000) Empirical modeling of proton induced SEU rates. IEEE Trans Nucl Sci 47(3):545–550

    Article  Google Scholar 

  3. Barak J (2001) Analytical microdosimetrry model for proton-induced SEU in modern devices. IEEE Trans Nucl Sci 48(6):1937–1945

    Article  Google Scholar 

  4. Barak J (2006) Simple calculations of proton SEU cross sections from heavy ion cross sections. IEEE Trans Nucl Sci 53(6):3336–3342

    Article  MathSciNet  Google Scholar 

  5. Baunmann R (2000) Effects of terrestrial radiation on integrated circuits. In: Nishi Y, Doering R (eds) Handbook of Semiconductor Manufacturing Technology, chap. 31. CRC Press

  6. Blackmore EW (2000) Operatiion of the TRIUMF (20-500 MeV) proton irradiation facility. Radiation Effects Data Workshop, TRIUMF, Vancouver, BC

  7. Buchner S, McMorrow D (2006) Single-event transients in bipolarlinear integrated circuits. IEEE Trans Nucl Sci 53:3079–3102

    Article  Google Scholar 

  8. Buchner S, McMorrow D, Poivey C, Howard J, Boulghassoul Y, Massengill LW, Pease R, Savage M (2004) Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions. IEEE Trans Nucl Sci 51:2776–2781

    Article  Google Scholar 

  9. Cannon EH, Cabanas-Holmen M, Wert J, Amort T, Brees R, Koehn J, Meaker B, Normand E (2010) Heavy ion, high-energy, and low-energy proton SEE sensitivity of 90-nm RHBD SRAMs. IEEE Trans Nucl Sci 57:3493–3499

    Google Scholar 

  10. Guo G, Shen D, Shi S, Chen Q, Liu J, Xu J, Lu X, Hui N, Cai L, Gao L, Wang H, Teng R, Wu B, Wang D, Du S, Fan H (2011) Irradiation facility and technique to increase LET for SEE testing on tandem accelerator. Radiation and Its Effects on Components and Systems (RADECS), p 724–728

  11. Melinger JS, Buchner S, McMorrow D, Stapor WJ, Weatherford TR, Campbell AB (1994) Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies. IEEE Trans Nucl Sci 41:2574–2584

    Article  Google Scholar 

  12. Miroshkin VV, Tverskoy MG (1994) Two parameter model for predicting SEU rate. IEEE Trans Nucl Sci 41(6):2085–2092

    Article  Google Scholar 

  13. Peterson EL (1996) Effects of terrestrial radiation on integrated circuits. IEEE Trans Nucl Sci 43(2):496–504

    Article  Google Scholar 

  14. Poivey C, Barth J, McCabe J, Label K (2002) A space weather event on the microwave anisotropy probe. In Proc. RADECS Conf., Padova, Italy, Sep. 19–20. p 43–46

  15. Ren Y, Fan L, Chen L, Wen S-J, Wong R, van Vonno NW, Witulski AF, Bhuva BL (2012) Single-event effects analysis of a pulse width modulator IC in a DC/DC converter. Springer J Electron Test Theory Appl 28(6):877–883

    Article  Google Scholar 

  16. Ren Y, Shi S-T, Chen L, Wang H-B, Gao L-J, Guo G, Wen S-J, Wong R, van Vonno NW (2013) Correlation of heavy-ion and laser testing on a DC/DC PWM controller. Springer J Electron Test Theory Appl 29(2):609–616

    Article  Google Scholar 

  17. Ziegler J, Biersack J, Littmark U (1996) The stopping and rang of ions in solids. Pergaman, New York

    Google Scholar 

Download references

Acknowledgments

This work was supported in part by NSERC, the Cisco Systems Inc. and Intersil Inc.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Y. Ren.

Additional information

Responsible Editor: V. D. Agrawal

Rights and permissions

Reprints and permissions

About this article

Cite this article

Ren, Y., He, AL., Shi, ST. et al. Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser. J Electron Test 30, 149–154 (2014). https://doi.org/10.1007/s10836-013-5431-7

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10836-013-5431-7

Keywords

Navigation